Appendix A: Warr
anted Specifications
Offset accuracy
±[0.005 × | offset – position | + DC Balance]
NOTE. Both the position and constant offset term must be converted to volts by
multiplying b
y the appropriate volts/div term.
Long-term
sample rate
and delay time
accuracy
±10 ppm over any 1mstimeinterval
Selectable Output: Main Trigger, Event, or AFG
Main Trigger: HIGH to LOW transition indicates the trigger occurred.
Event Out:
The instrument will output a negative edge during a specified trigger
event in a test application.
A falling edge occurs when there is a specified event in a test application (i.e.
the wavef
orm crosses the violation threshold in the limit / mask test application).
A rising edge occurs when the trigger system begins waiting for the next test
application event.
AFG: The t
rigger output signal from the AFG.
Characteristic
Limits
Vout (HI) 2.25 V open circuit; 0.9 V into a 50 load to ground
Auxiliary output
(AUX OUT)
Vout (
LO)
0.7 V
into a load of 4mA;0.25 V into a 50 load to ground
Instrument
bandwidth
(incl
udes
instruments
with bandwidth
upgr
ades)
Bandwidth Selection RMS Noise
1GHz
Full bandwidth
<(150 V + 8% of Volts/div setting)
250
MHz bandwidth limit
<(150 V + 6% of Volts/div setting)
20 MHz bandwidth limit
<(
100 V + 4% of Volts/div setting)
Full bandwidth
<(150 V + 8% of Volts/div setting)
2
50 MHz bandwidth limit
<(150 V + 6% of Volts/div setting)
500 MHz
20 MHz bandwidth limit
<(100 V + 4% of Volts/div setting)
Full bandwidth
<(150 V + 8% of V /div setting)
250 MHz bandwidth limit
<(150 V + 6% of V /div setting)
350 MHz
20 MHz bandwidth limit
<(100 V + 4% of V /div setting)
Full bandwidth
<(150 V + 6% of Volts/div setting)
200 MHz
20 MHz bandwidth limit
<(100 V + 4% of Volts/div setting)
100 MHz Full bandwidth
<(150 V + 6% of Volts/div Setting)
Random Noise,
Sampl
e acquisition
mode
20 MHz bandwidth limit
<(100 V + 4% of Volts/div Setting)
194 MDO3000 Series Oscilloscopes User Manual
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