Nikon eclipse Ci-S User Manual

1
Chapter 1-1
Microscopy Procedures
1
Microscopy Procedures
Bright-field Microscopy
1
Bright-field Microscopy
1.1
System Configuration and Controls
This section explains an example system configuration and the controls required for bright-field microscopy using the
ECLIPSE Ci-S/Ci-L.
Names of components are denoted in the following manner: [Eyepiece].
CLAMP
TORQUE
ND4
ND8
OUT
IN
DSC
MODEL ECLIPSE Ci-S
NIKON CORPORATION
TOKYO, JAPAN
100–240V~
0.9A
50/60Hz
MADE IN CHINA
This device complies with Part 15 of the FCC
Rules. Operation is subject to the following two
conditions:
(1) this device may not cause harmful interference,
and (2) this device must accept any interference
received, including interference that may cause
undesired operation.
This Class A digital apparatus complies with
Canadian ICES-003.
Cet appareil numérique de la classe A est
confirme à la norme NMB-003 du Canada.
940001
4N75
INSPECTION
EQUIPMENT
70
60
50
40
30
20
10
0
90
80
X knob
Condenser focus knob
Dia-illumination
brightness control knob
Y knob
Grip
Condenser centering
screw
AC inle
t
Input voltage label
[Eyepiece]
[Objective]
[Stage]
[Condenser]
[Tube]
[Nosepiece]
[Main body]
(The figure shows
ECLIPSE Ci-S.
)
Coarse focus torque
adjustment knob
Optical path switching lever
A
perture diaphragm leve
r
Power switch
Coarse focus knob
Fine focus knob
Capture button
Moving claw of the
specimen holder
ND filter IN/OUT switch
(equipped with Ci-S only)
Condenser focus knob
Field diaphragm dial
Diopter adjustment ring
Coarse focus clamp ring
Coarse focus knob
Fine focus knob
DSC connecto
r

Nikon eclipse Ci-S Specifications

General

Brand	Nikon
Model	eclipse Ci-S
Category	Microscope
Language	English