Troubleshooting
2-17
2.11 Built-In test documentation
The following paragraphs provide a detailed description of each Built-In Test. Refer to para-
graph 2.10 for basic information on how to use the Built-In Tests. The following documentation
is provided for each Built-In Test:
1. Test Type: Some tests are pass/fail type tests while others are circuit exercises that are used
for subsequent tests.
2. Fault Message: For pass/fail type tests, a message is provided to explain the cause of the
failure. The fault message may be displayed during test failure analysis by pressing the
INFO key.
3. Description: Provides a description of the circuit being tested.
4. Drawing Reference: Identifies the component layout drawing associated with the described
circuitry. Component layout drawings are located at the end of Section 4.
5. Components: When appropriate, possible defective components and/or circuits are listed. It
is left to the expertise of the repair technician to pin-point the problem.
6. Shift Register Bit Patterns: For tests starting with 200.1, the logic states for the R1_STB,
R2_STB, MUX_STB, and AD_STB control shift registers are provided. After one of these
tests is manually run, you can check the registers for the correct logic levels. Functional de-
scriptions for the register bits are provided where applicable.
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