7½ Digit Multimeter User's Manual Section 8:
Grading and binning resistors
DMM7510-900-01 Rev. C / September 2019 8-5
Using SCPI commands
This sequence of SCPI commands grades resistors into bins based on the measured accuracy.
You may need to make changes so that this code will run in your programming environment.
Send the commands in the following tables to setup and run this example application.
Command Description
:TRAC:MAKE "bufferVar", 1000000
:SENS:FUNC "FRES"
:SENS:FRES:NPLC 1
:SENS:AZER:ONCE
:SENS:FRES:OCOM ON
:DIGital:LINE1:MODE DIG, OUT
:DIG:LINE2:MODE DIG, OUT
:DIG:LINE3:MODE DIG, OUT
:DIG:LINE4:MODE DIG, OUT
:DIG:LINE1:STAT 0
:DIG:LINE2:STAT 0
:DIG:LINE3:STAT 0
:DIG:LINE4:STAT 0
:DIG:LINE5:MODE TRIG, IN
:TRIGger:DIG5:IN:EDGE FALL
:DIG:LINE6:MODE TRIG, OUT
:TRIGger:DIGital6:OUT:LOGic NEG
:TRIG:DIG6:OUT:PULSewidth 10e-6
:TRIG:DIG6:OUT:STIMulus NOT1
:TRIGger:LOAD "GradeBinning", 100, 5, .1,
.1,
120, 80, 15, 4, 110, 90, 1, 105, 95, 2, 101,
99, 3, "bufferVar"
INIT
*WAI
:DISP:SCR SWIPE_USER
:DISP:USER1: TEXT "Test Completed"
Reset the DMM7510 to default settings
Make a buffer named bufferVar with a
capacity of 1,000,000 readings
Set instrument to measure 4-wire resistance
Set the number of power line cycles (NPLC)
to 1
Enable autozero once
Enable offset compensation for more accurate
resistance readings
Configure digital I/O lines 1 through 4 as
digital outputs; these are used to output
binning code to the component handler
Set the states of digital I/O lines 1 through 4
to bit low
Configure digital I/O line 5 as trigger input to
detect start-of-test trigger
Set trigger detector to detect falling edge on
digital I/O line 5
Configure digital I/O line 6 as a trigger output
used to send end-of-test trigger with negative
logic and output pulse width of 10 µs.
The trigger pulse occurs when the notify block
generates an event
Define the GradeBinning trigger-model
template
Initiate the trigger model
Set the front-panel display to the USER swipe
screen
Display "Test Completed" when the binning