Operation
4-5
*RST
:TRIGger:SEQuence:COUNt:AUTO ON”
:SCAN <list>
:INIT
The Þrst command resets the mainframe to a default
scan conÞguration. The second command automatical-
ly sets the channel count to the number of channels in
the scan list, the third command deÞnes the scan list,
and the fourth command takes the Model 7001 out of
the idle state.
The following program will perform a single scan
through all 40 channels of a multiplexer card installed
in slot 1:
10 OUTPUT 707; “*RST”
20 OUTPUT 707; “:trig:seq:coun:auto on”
30 OUTPUT 707; “:scan (@ 1!1!1:1!4!10)”
40 OUTPUT 707; “:init”
50 END
Line 10 Selects a default conÞguration for the scan.
Line 20 Sets channel count to the scan-list-length.
Line 30 DeÞnes the scan list.
Line 40 Take the Model 7001 out of the idle state. The
scan is conÞgured to start as soon as this
command is executed.
When the above program is run, the scan will be com-
pleted in approximately 240msec (3msec delay for each
relay close and a 3msec delay for each open), which is
too fast to view from the front panel. An additional re-
lay delay can be added to the program to slow down
the scan for viewing. The program is modiÞed by add-
ing line 25 to slow down the scan. Also, Line 5 is added
to the beginning of the program to ensure that all chan-
nels are open before the scan is started.
5 OUTPUT 707; “:open all”
10 OUTPUT 707; “*RST”
20 OUTPUT 707; “:trig:seq:coun:auto on”
25 OUTPUT 707; “:trig:del 0.25”
30 OUTPUT 707; “:scan (@ 1!1!1:1!4!10)”
40 OUTPUT 707; “:INIT”
50 END
Line 5 Opens all channels.
Line 25 Sets a 1/4 second delay after each channel
closes.
4.4 Matrix switching examples
Some applications to test thick Þlm resistor networks
and transistors are provided in the following para-
graphs. These applications are intended to demon-
strate the versatility of using the matrix card in test
systems.
4.4.1 Thick film resistor network testing
A dedicated matrix system for testing thick Þlm resis-
tor networks is shown in Figure 4-4. This particular
system provides two different methods to check thick
Þlms; four-wire resistance measurements, and voltage
measurements using an applied voltage.
The system shown in Figure 4-4 tests two 4-element
thick Þlms, but can be expanded to test more by simply
using additional Model 7012 matrix cards. The Model
7001 will accommodate two matrix cards. Daisy-chain-
in six Model 7001s expands the system to 12 matrix
cards allowing 24 four-element thick Þlms to be tested.
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