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Series 2600
Keithley Series 2600 User Manual
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2
Table of Contents
Default Chapter
2
Table of Contents
2
List of Illustrations
6
Introduction
8
Hardware Configuration
8
System Configuration
8
Figure 1-1. Typical System Configuration for Applications
8
Remote/Local Sensing Considerations
9
Section 1 General Information
8
Graphing
9
Introduction
10
Section 2 Two-Terminal Device Tests
10
Instrument Connections
10
Voltage Coefficient Tests of Resistors
10
Test Configuration
10
Voltage Coefficient Calculations
10
Voltage Coefficient Test
10
Figure 2-1. Series 2600 Two-Wire Connections
10
Figure 2-2. Voltage Coefficient Test Configuration
10
Typical Program 1 Results
12
Program 1 Description
12
Capacitor Leakage Test
12
Test Configuration
12
Leakage Resistance Calculations
12
Figure 2-3. Test Configuration for Capacitor Leakage Test
12
Measurement Considerations
13
Example Program
13
Capacitor Leakage Test
13
Typical Program 2 Results
13
Program 2 Description
14
Diode Characterization
14
Test Configuration
14
Measurement Considerations
14
Example Program 3
14
Figure 2-4. Staircase Sweep
14
Figure 2-5. Test Configuration for Diode Characterization
14
Typical Program 3 Results
15
Program 3 Description
15
Figure 2-6. Program 3 Results: Diode Forward
15
Using Log Sweeps
16
Using Pulsed Sweeps
16
Introduction
18
Section 3 Bipolar Transistor Tests
18
Instrument Connections
18
Common-Emitter Characteristics
18
Figure 3-1. Test Configuration for Common-Emitter Tests
18
Test Configuration
19
Measurement Considerations
19
Example Program
19
Common-Emitter Characteristics
19
Typical Program 4 Results
20
Program 4 Description
20
Gummel Plot
20
Test Configuration
20
Local Sensing
20
Figure 3-2 . Program 4 Results: Common-Emitter
20
Measurement Considerations
21
Example Program 5: Gummel Plot
21
Figure 3-3. Gummel Plot Test Configuration
21
Typical Program 5 Results
22
Program 5 Description
22
Figure 3-4. Program 5 Results: Gummel Plot
22
Current Gain
23
Gain Calculations
23
Test Configuration for Search Method
23
Measurement Considerations
23
Example Program 6A: DC Current Gain Using Search Method
23
Figure 3-5 . Test Configuration for Current Gain Tests
23
Typical Program 6A Results
24
Program 6A Description
24
Modifying Program 6A
24
Configuration for Fast Current Gain Tests
25
Example Program 6B: DC Current Gain Using Fast Method
25
Figure 3-6. Test Configuration for Fast Current Gain Tests
25
Program 6B Description
26
Example Program 7: AC Current Gain
26
Typical Program 7 Results
27
Program 7 Description
27
Modifying Program 7
27
Transistor Leakage Current
27
Test Configuration
27
Example Program 8: I
28
Ceo
28
Figure 3-7. Configuration for I
28
Program 8 Description
28
Test
28
Typical Program 8 Results
28
Figure 3-8. Program 8 Results: I
29
Modifying Program 8
29
Common-Source Characteristics
30
Test Configuration
30
Example Program 9: Common-Source Characteristics
30
Typical Program 9 Results
31
Program 9 Description
31
Figure 4-1. Test Configuration for Common-Source Tests
31
Modifying Program 9
32
Section 4 FET Tests
30
Introduction
30
Instrument Connections
30
Transconductance Tests
32
Test Configuration
32
Figure 4-2 . Program 9 Results: Common-Source
32
Example Program 10: Transconductance
33
Vs . Gate Voltage Test
33
Figure 4-3. Configuration for Transductance Tests
33
Typical Program 10 Results
34
Program 10 Description
34
Figure 4-4. Program 10 Results: Transconductance Vs. V
34
Figure 4-5 . Program 10 Results: Transconductance Vs
34
Threshold Tests
35
Search Method Test Configuration
35
Example Program 11A: Threshold Voltage
35
Figure 4-6 . Configuration for Search Method
35
Program 11A Description
36
Modifying Program 11A
36
Self-Bias Threshold Test Configuration
36
Example Program 11B: Self-Bias
37
Threshold Voltage Tests
37
Figure 4-7. Configuration for Self-Bias Threshold Tests
37
Program 11B Description
38
Modifying Program 11B
38
Introduction
40
Section 5 Using Substrate Bias
40
Substrate Bias Instrument Connections
40
Figure 5-1. TSP-Link Connections for Two Instruments
40
Example Program 12: Substrate Current Vs. Gate-Source Voltage
41
Figure 5-2. TSP-Link Instrument Connections
41
Program 12 Test Configuration
41
Source-Measure Unit Substrate Biasing
41
Voltage Source Substrate Bias Connections
41
Figure 5-3. Program 12 Test Configuration
42
Figure 5-4. Program 12 Typical Results: I
43
Program 12 Description
43
Typical Program 12 Results
43
Example Program 13: Common-Source Characteristics with Source-Measure Unit
44
Substrate Bias
44
Figure 5-5. Program 13 Test Configuration
44
Figure 5-6. Program 13 Typical Results: Common-Source Characteristics with Substrate Bias
45
Modifying Program 12
44
Program 13 Test Configuration
44
Modifying Program 13
46
Program 13 Description
46
Typical Program 13 Results
46
5.3 Source-Measure Unit Substrate Biasing. . . . .5-2
41
BJT Substrate Biasing
46
Program 14 Test Configuration
46
Example Program 14: Common-Emitter
46
Figure 5-7. Program 14 Test Configuration
47
Typical Program 14 Results
48
Program 14 Description
48
Figure 5-8. Program 14 Typical Results: Common-Emitter Characteristics with Substrate Bias
48
Introduction
50
Program 15 Test Configuration
50
Example Program 15: High Current
50
Source and Voltage Measure
50
Figure 6-1. High Current (Smus in Parallel)
50
Program 15 Description
51
Section 6 High Power Tests
50
Instrument Connections
51
Program 16 Test Configuration
51
Example Program 16: High Voltage Source and Current Measure
51
Figure 6-2. High Voltage (Smus in Series)
51
Program 16 Description
52
Appendix A Scripts
54
Section 2. Two-Terminal Devices
54
Program 1. Voltage Coefficient of Resistors
54
Program 2. Capacitor Leakage Test
58
Program 3. Diode Characterization
61
Program 3A. Diode Characterization Linear Sweep
61
Program 3B. Diode Characterization Log Sweep
64
Program 3C. Diode Characterization Pulsed Sweep
67
Section 3. Bipolar Transistor Tests
72
Program 4. Common-Emitter Characteristics
72
Program 5. Gummel Plot
77
Section 6. High Power Tests
81
Program 6. Current Gain
81
Program 6A . Current Gain (Search Method
81
Program 6B . Current Gain (Fast Method
85
Program 7. AC Current Gain
89
Program 8 . Transistor Leakage (ICEO
92
Section 4. FET Tests
96
Program 9. Common-Source Characteristics
96
Program 10. Transconductance
101
Program 11. Threshold
105
Program 11A . Threshold (Search
105
Program 11B . Threshold (Fast
109
Section 5. Using Substrate Bias
113
Program 12 . Substrate Current Vs . Gate-Source
113
Sb Gs
113
With Substrate Bias
117
With Substrate Bias
124
Section 6. High Power Tests
131
Current Measurement
133
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Keithley Series 2600 Specifications
General
Brand
Keithley
Model
Series 2600
Category
Measuring Instruments
Language
English
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