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Keithley Series 2600 User Manual

Keithley Series 2600
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2-3
SECTION 2
Two-terminal Device Tests
2.3.5 Typical Program 1 Results
The actual voltage coefficient you obtain using the program will,
of course, depend on the resistor being tested. The typical voltage
coefficient obtained for a 10GW resistor (Keithley part number
R-319-10G) was about 8ppm/V (0.008%/V).
2.3.6 Program 1 Description
At the start of the program, the instrument is reset to default con-
ditions, and the error queue and data storage buffers are cleared.
The following configuration is then applied before the data col-
lection begins:
Source V, DC mode•
Local sense•
100mA compliance, autorange measure•
1NPLC line cycle integration•
v1src:
• 100V
v2src:
• 200V
The instrument then sources
v1src
, checks the source for com-
pliance in the function named
Check _ Comp()
, and performs a
measurement of the current if compliance is false. The source then
applies
v2src
and performs a second current measurement.
The function
Calc _ Val()
then performs the calculation of the
voltage coefficient based on the programmed source values and
the measured current values as described in Section 2.3.2, Voltage
Coefficient Calculations.
The instrument output is then turned off and the function
Print _ Data()
is run to print the data to the TSB window.
Note: If the compliance is true, the instrument will abort the pro-
gram and print a warning to the TSB window. Check the DUT
and cabling to make sure everything is connected correctly and
re-run the test.
2.4 Capacitor Leakage Test
One important parameter associated with capacitors is leakage
current. Once the leakage current is known, the insulation resist-
ance can be easily calculated. The amount of leakage current in
a capacitor depends both on the type of dielectric as well as the
applied voltage. With a test voltage of 100V, for example, ceramic
dielectric capacitors have typical leakage currents in the nanoamp
to picoamp range, while polystyrene and polyester dielectric
capacitors exhibit a much lower leakage current—typically in the
femtoamp (10
–15
A) range
2.4.1 Test Configuration
Figure 2-3 shows the test configuration for the capacitor leakage
test. The instrument sources the test voltage across the capacitor,
and it measures the resulting leakage current through the device.
The resistor, R, is included for current limiting, and it also helps
to reduce noise. A typical value for R is 1MW, although that value
can be decreased for larger capacitor values. Note, however, that
values less than 10kW are not recommended.
2.4.2 Leakage Resistance Calculations
Once the leakage current is known, the leakage resistance can
easily be calculated from the applied voltage and leakage current
value as follows:
R = V/I
Resistor R required to
limit current and
reduce noise.
Typical value: 1M
Minimum value: 10k
Series 2600
System
SourceMeter
Channel A
Source V,
Measure I
I
V
R
C
Test
Fixture
Capacitor
Under
Test
Output HI I
LKG
Output LO
Figure 2-3. Test configuration for capacitor leakage test

Table of Contents

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Keithley Series 2600 Specifications

General IconGeneral
ModelSeries 2600
Measurement FunctionsVoltage, Current, Resistance, Power
ResolutionUp to 6.5 digits
Current Source RangeUp to 10A
Communication InterfacesGPIB, USB
ApplicationsSemiconductor testing
CategorySource Measure Unit (SMU)
ChannelsSingle or Dual Channel (varies by model)

Summary

Section 1 General Information

1.1 Introduction

Discusses system configurations for application programs.

1.2 Hardware Configuration

Details system hardware configuration.

1.2.1 System Configuration

Describes the overall hardware configuration of a test system.

1.2.2 Remote/Local Sensing Considerations

Discusses sensing methods for optimizing accuracy.

1.3 Graphing

Explains how to visualize data using graphing.

Section 2 Two-terminal Device Tests

2.1 Introduction

Introduces tests for two-terminal devices.

2.2 Instrument Connections

Details instrument connections for two-terminal device tests.

2.3 Voltage Coefficient Tests of Resistors

Explains testing voltage coefficient of resistors.

2.4 Capacitor Leakage Test

Details testing capacitor leakage current.

2.5 Diode Characterization

Explains diode characterization tests.

Section 3 Bipolar Transistor Tests

3.1 Introduction

Introduces bipolar transistor tests.

3.2 Instrument Connections

Details instrument connections for bipolar transistor tests.

3.3 Common-Emitter Characteristics

Explains testing common-emitter characteristics for transistors.

3.4 Gummel Plot

Explains generating Gummel plots for transistors.

3.5 Current Gain

Discusses methods for measuring DC and AC current gain.

3.6 Transistor Leakage Current

Explains testing transistor leakage current.

Section 4 FET Tests

4.1 Introduction

Introduces FET testing.

4.2 Instrument Connections

Details instrument connections for FET tests.

4.3 Common-Source Characteristics

Explains common-source characteristics for FETs.

4.4 Transconductance Tests

Details transconductance testing for FETs.

4.5 Threshold Tests

Explains methods for determining FET threshold voltage.

Section 5 Using Substrate Bias

5.1 Introduction

Introduces substrate bias concepts.

5.2 Substrate Bias Instrument Connections

Details instrument connections for substrate bias.

5.3 Source-Measure Unit Substrate Biasing

Discusses SMU substrate biasing methods.

5.4 BJT Substrate Biasing

Explains substrate bias for BJTs.

Section 6 High Power Tests

6.1 Introduction

Introduces high power testing challenges.

6.1.1 Program 15 Test Configuration

Details test setup for high current tests.

6.1.2 Example Program 15: High Current Source and Voltage Measure

Shows high current sourcing with voltage measurement.

6.2 Instrument Connections

Details instrument connections for high power tests.

6.2.1 Program 16 Test Configuration

Details test setup for high voltage tests.

6.2.2 Example Program 16: High Voltage Source and Current Measure

Shows high voltage sourcing with current measurement.

Appendix A Scripts

Two-Terminal Device Scripts

Contains scripts for two-terminal device tests.

Bipolar Transistor Scripts

Contains scripts for bipolar transistor tests.

High Power Test Scripts

Contains scripts for high power tests.

FET Test Scripts

Contains scripts for FET tests.

Substrate Bias Scripts

Contains scripts for substrate bias tests.

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