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Keithley Series 2600 User Manual

Keithley Series 2600
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5-6
SECTION 5
Using Substrate Bias
6. Select the TSPLINK_CFG menu. (If the Series 2600
instruments used have firmware Revision 1.4.0 or later
installed, the menu name should be TSPLINK.)
7. Select the RESET to initialize the TSP-Link.
Turn on the computer and start Test Script Builder (TSB). 5.
Once the program has started, open a session by connecting
to the master instrument. For details on how to use TSB, see
the Series 2600 Reference Manual.
You can simply copy and paste the code from Appendix A in
this guide into the TSB script editing window (Program 13),
manually enter the code from the appendix, or import the
TSP le FET_Comm_Source_Vsb.tspafter downloading it to
your PC.
If your computer is currently connected to the Internet, click
on the following link to begin downloading: http://www.
keithley.com/data?asset=50921.
Install an NPN FET such as an SD210 in the appropriate tran-6.
sistor socket of the test fixture.
Now, we must send the code to the instrument. The simplest 7.
method is to right-click in the open script window of TSB and
select Run as TSP file. This will compile the code and place
it in the volatile run-time memory of the instrument. To store
the program in non-volatile memory, see the “TSP Program-
ming Fundamentals” section of the Series 2600 Reference
Manual.
Once the code has been placed in the instrument run-time 8.
memory, we can run it at any time simply by calling the
function ‘FET_Comm_Source_Vsb(). This can be done by
typing the text ‘
FET _ Comm _ Source _ Vsb()
after the
active prompt in the Instrument Console line of TSB.
In the program 9. FET_Comm_Source_Vsb().tsp, the function
FET _ Comm _ Source _ Vsb(vgsstart, vgsstop,
vgssteps, vdsstart, vdsstop, vdssteps,
vsbsource)
is created.
vgsstart
• represents the start value for the gate-source
voltage sweep
vgsstop
• represents the stop value for the gate-source
voltage sweep
vgssteps
• represents the number of steps in the sweep
vdsstart
• represents the start value for the drain-source
voltage sweep
vdsstop
• represents the stop value for the drain-source
voltage sweep
vdssteps
• represents the number of steps in the sweep
vsbsource
• represents the substrate bias voltage
If these values are left blank, the function will use the default
values given to the variables, but you can specify each vari-
able value by simply sending a number that is in-range in the
function call. As an example, if you wanted to have the gate-
source (V
GS
) voltage sweep start value at 1V, the gate-source
sweep stop value at 12V and the number of steps to be 10,
the drain-source (V
DS
) voltage sweep start value at 1V, the
drain-source sweep stop value at 12V and the number of steps
to be 80, and the substrate bias to be –2V, you would send
Common-Source Characteristics
with Substrate Bias (SD210)
V
DS
(Volts)
V
GS
= 10V
V
GS
= 7.5V
V
GS
= 5V
V
GS
= 2.5V
V
GS
= 0V
I
DS
(Amps)
1.00E–01
8.00E–02
6.00E–02
4.00E–02
2.00E–02
0.00E+00
0 1 2 3 4 5 6 7 8 9 10
Figure 5-6. Program 13 typical results: Common-source characteristics with substrate bias

Table of Contents

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Keithley Series 2600 Specifications

General IconGeneral
ModelSeries 2600
Measurement FunctionsVoltage, Current, Resistance, Power
ResolutionUp to 6.5 digits
Current Source RangeUp to 10A
Communication InterfacesGPIB, USB
ApplicationsSemiconductor testing
CategorySource Measure Unit (SMU)
ChannelsSingle or Dual Channel (varies by model)

Summary

Section 1 General Information

1.1 Introduction

Discusses system configurations for application programs.

1.2 Hardware Configuration

Details system hardware configuration.

1.2.1 System Configuration

Describes the overall hardware configuration of a test system.

1.2.2 Remote/Local Sensing Considerations

Discusses sensing methods for optimizing accuracy.

1.3 Graphing

Explains how to visualize data using graphing.

Section 2 Two-terminal Device Tests

2.1 Introduction

Introduces tests for two-terminal devices.

2.2 Instrument Connections

Details instrument connections for two-terminal device tests.

2.3 Voltage Coefficient Tests of Resistors

Explains testing voltage coefficient of resistors.

2.4 Capacitor Leakage Test

Details testing capacitor leakage current.

2.5 Diode Characterization

Explains diode characterization tests.

Section 3 Bipolar Transistor Tests

3.1 Introduction

Introduces bipolar transistor tests.

3.2 Instrument Connections

Details instrument connections for bipolar transistor tests.

3.3 Common-Emitter Characteristics

Explains testing common-emitter characteristics for transistors.

3.4 Gummel Plot

Explains generating Gummel plots for transistors.

3.5 Current Gain

Discusses methods for measuring DC and AC current gain.

3.6 Transistor Leakage Current

Explains testing transistor leakage current.

Section 4 FET Tests

4.1 Introduction

Introduces FET testing.

4.2 Instrument Connections

Details instrument connections for FET tests.

4.3 Common-Source Characteristics

Explains common-source characteristics for FETs.

4.4 Transconductance Tests

Details transconductance testing for FETs.

4.5 Threshold Tests

Explains methods for determining FET threshold voltage.

Section 5 Using Substrate Bias

5.1 Introduction

Introduces substrate bias concepts.

5.2 Substrate Bias Instrument Connections

Details instrument connections for substrate bias.

5.3 Source-Measure Unit Substrate Biasing

Discusses SMU substrate biasing methods.

5.4 BJT Substrate Biasing

Explains substrate bias for BJTs.

Section 6 High Power Tests

6.1 Introduction

Introduces high power testing challenges.

6.1.1 Program 15 Test Configuration

Details test setup for high current tests.

6.1.2 Example Program 15: High Current Source and Voltage Measure

Shows high current sourcing with voltage measurement.

6.2 Instrument Connections

Details instrument connections for high power tests.

6.2.1 Program 16 Test Configuration

Details test setup for high voltage tests.

6.2.2 Example Program 16: High Voltage Source and Current Measure

Shows high voltage sourcing with current measurement.

Appendix A Scripts

Two-Terminal Device Scripts

Contains scripts for two-terminal device tests.

Bipolar Transistor Scripts

Contains scripts for bipolar transistor tests.

High Power Test Scripts

Contains scripts for high power tests.

FET Test Scripts

Contains scripts for FET tests.

Substrate Bias Scripts

Contains scripts for substrate bias tests.

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