Keithley Series 2600 User Manual

A-43
APPENDIX A
Scripts
Section 4. FET Tests
Program 9. Common-Source Characteristics
--[[
FET_Comm_Source(): USES TABLES
This program applies a bias to the gate-source of an FET (VGS) and sweeps voltage on the
drain-source (VDS). The VDS and ID values at each VGS bias are then printed.
Required equipment:
(1) Dual-channel Keithley Series 2600 System SourceMeter instrument
(1) SD210 N-Channel MOSFET
Running this script creates functions that can be used to measure the common source
characteristics of
FETs. The default values are for an N-channel MOSFET type SD210.
The functions created are:
1. FET_Comm_Source(vgsstart, vgsstop, vgssteps, vdsstart, vdsstop, vdssteps)
--Default values vgsstart = 0, vgsstop = 10V, vgssteps = 5, vdstart = 0V,
vdstop = 10V, vdsteps = 100
2. Print_Data(vgssteps,vdssteps, vds_data,Id_data, vgs_data)
See detailed information listed in individual functions.
1) From Test Script Builder
- At the TSP> prompt in the Instrument Control Panel, type FET_Comm_Source()
2) From an external program
- Send the entire program text as a string using standard GPIB Write calls.
Rev1: JAC 6.18.2007
]]--
------------------ Keithley TSP Function ------------------
function FET_Comm_Source(vgsstart, vgsstop, vgssteps, vdsstart, vdsstop, vdssteps)
--Configure SMUB to source a bias
--voltage on the gate-source (Vgs) and SMUA performs a voltage sweep on the drain-source
(Vds) from start to stop in a --user-defined number of steps. SMUB then increments to next
bias value and continues to the stop value.
--Returns measured Vgs, Vds, and Id values.
--Global variables
local l_vrange = 40 --

Keithley Series 2600 Specifications

General

Model	Series 2600
Measurement Functions	Voltage, Current, Resistance, Power
Resolution	Up to 6.5 digits
Current Source Range	Up to 10A
Communication Interfaces	GPIB, USB
Applications	Semiconductor testing
Category	Source Measure Unit (SMU)
Channels	Single or Dual Channel (varies by model)

Summary

Section 1 General Information

1.1 Introduction

Discusses system configurations for application programs.

1.2 Hardware Configuration

Details system hardware configuration.

1.2.1 System Configuration

Describes the overall hardware configuration of a test system.

1.2.2 Remote/Local Sensing Considerations

Discusses sensing methods for optimizing accuracy.

1.3 Graphing

Explains how to visualize data using graphing.

Section 2 Two-terminal Device Tests

2.1 Introduction

Introduces tests for two-terminal devices.

2.2 Instrument Connections

Details instrument connections for two-terminal device tests.

2.3 Voltage Coefficient Tests of Resistors

Explains testing voltage coefficient of resistors.

2.4 Capacitor Leakage Test

Details testing capacitor leakage current.

2.5 Diode Characterization

Explains diode characterization tests.

Section 3 Bipolar Transistor Tests

3.1 Introduction

Introduces bipolar transistor tests.

3.2 Instrument Connections

Details instrument connections for bipolar transistor tests.

3.3 Common-Emitter Characteristics

Explains testing common-emitter characteristics for transistors.

3.4 Gummel Plot

Explains generating Gummel plots for transistors.

3.5 Current Gain

Discusses methods for measuring DC and AC current gain.

3.6 Transistor Leakage Current

Explains testing transistor leakage current.

Section 4 FET Tests

4.1 Introduction

Introduces FET testing.

4.2 Instrument Connections

Details instrument connections for FET tests.

4.3 Common-Source Characteristics

Explains common-source characteristics for FETs.

4.4 Transconductance Tests

Details transconductance testing for FETs.

4.5 Threshold Tests

Explains methods for determining FET threshold voltage.

Section 5 Using Substrate Bias

5.1 Introduction

Introduces substrate bias concepts.

5.2 Substrate Bias Instrument Connections

Details instrument connections for substrate bias.

5.3 Source-Measure Unit Substrate Biasing

Discusses SMU substrate biasing methods.

5.4 BJT Substrate Biasing

Explains substrate bias for BJTs.

Section 6 High Power Tests

6.1 Introduction

Introduces high power testing challenges.

6.1.1 Program 15 Test Configuration

Details test setup for high current tests.

6.1.2 Example Program 15: High Current Source and Voltage Measure

Shows high current sourcing with voltage measurement.

6.2 Instrument Connections

Details instrument connections for high power tests.

6.2.1 Program 16 Test Configuration

Details test setup for high voltage tests.

6.2.2 Example Program 16: High Voltage Source and Current Measure

Shows high voltage sourcing with current measurement.

Appendix A Scripts

Two-Terminal Device Scripts

Contains scripts for two-terminal device tests.

Bipolar Transistor Scripts

Contains scripts for bipolar transistor tests.

High Power Test Scripts

Contains scripts for high power tests.

FET Test Scripts

Contains scripts for FET tests.

Substrate Bias Scripts

Contains scripts for substrate bias tests.