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Keithley Series 2600 User Manual

Keithley Series 2600
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3-4
SECTION 3
Bipolar Transistor Tests
measures I
B
. SMUA sets V
CE
to the desired xed value, and it also
measures I
C
.
Due to the low current measurements associated with this type of
testing, the Keithley Model 2636 System SourceMeter instrument
is recommended. Its low level current measurement capabilities
and dual-channel configuration are ideal for producing high
quality Gummel plots of transistors.
3.4.2 Measurement Considerations
As written, the range of V
BE
test values is from 0V to 0.7V in 0.01V
increments. It may be necessary, however, to change these limits
for best results with your particular device. Low currents will be
measured so take the usual low current precautions.
3.4.3 Example Program 5: Gummel Plot
Program 5 demonstrates the basic programming techniques
for generating a Gummel plot. Follow these steps to run this
program:
With the power off, connect a dual-channel System Source-1.
Meter instrument to the computer’s IEEE-488 interface.
Connect the test xture to both units using appropriate 2.
c a b l e s .
Turn on the instrument and allow the unit to warm up for two 3.
hours for rated accuracy.
Turn on the computer and start Test Script Builder (TSB). Once 4.
the program has started, open a session by connecting to the
instrument. For details on how to use TSB, see the Series 2600
Reference Manual.
You can simply copy and paste the code from Appendix A in 5.
this guide into the TSB script editing window (Program 5),
manually enter the code from the appendix, or import the TSP
file ‘Gummel.tsp’ after downloading it to your PC.
If your computer is currently connected to the Internet, you
can click on this link to begin downloading: http://www.
keithley.com/data?asset=50918
Install an NPN transistor such as a 2N5089 in the appropriate 6.
transistor socket of the test fixture.
Now, we must send the code to the instrument. The simplest 7.
method is to right-click in the open script window of TSB,
and select ‘Run as TSP file’. This will compile the code and
place it in the volatile run-time memory of the instrument.
To store the program in non-volatile memory, see the “TSP
Programming Fundamentals” section of the Series 2600 Refer-
ence Manual.
Once the code has been placed in the instrument run-time 8.
memory, we can run it at any time simply by calling the
function ‘Gummel(). This can be done by typing the text
G u m m e l()
after the active prompt in the Instrument Con-
sole line of TSB.
In the program ‘Gummel.tsp, the function 9.
Gummel
(vbestart, vbestop, vbesteps, vcebias)
is
created.
vbestart
• represents the sweep start voltage value on
the base of the transistor
vbestop
• represents the sweep stop value
vbesteps
• is the number of steps in the base
voltage sweep
I
V
I
V
Series 2600
System
SourceMeter
Channel A
Source V
CE
,
Measure I
C
Series 2600
System
SourceMeter
Channel B
Sweep V
BE
Measure I
B
V
CE
V
BE
Test
Fixture
Transistor
Under Test
Output HI
Output HI
Output LO
Output LO
I
B
I
C
Figure 3-3. Gummel plot test configuration

Table of Contents

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Keithley Series 2600 Specifications

General IconGeneral
ModelSeries 2600
Measurement FunctionsVoltage, Current, Resistance, Power
ResolutionUp to 6.5 digits
Current Source RangeUp to 10A
Communication InterfacesGPIB, USB
ApplicationsSemiconductor testing
CategorySource Measure Unit (SMU)
ChannelsSingle or Dual Channel (varies by model)

Summary

Section 1 General Information

1.1 Introduction

Discusses system configurations for application programs.

1.2 Hardware Configuration

Details system hardware configuration.

1.2.1 System Configuration

Describes the overall hardware configuration of a test system.

1.2.2 Remote/Local Sensing Considerations

Discusses sensing methods for optimizing accuracy.

1.3 Graphing

Explains how to visualize data using graphing.

Section 2 Two-terminal Device Tests

2.1 Introduction

Introduces tests for two-terminal devices.

2.2 Instrument Connections

Details instrument connections for two-terminal device tests.

2.3 Voltage Coefficient Tests of Resistors

Explains testing voltage coefficient of resistors.

2.4 Capacitor Leakage Test

Details testing capacitor leakage current.

2.5 Diode Characterization

Explains diode characterization tests.

Section 3 Bipolar Transistor Tests

3.1 Introduction

Introduces bipolar transistor tests.

3.2 Instrument Connections

Details instrument connections for bipolar transistor tests.

3.3 Common-Emitter Characteristics

Explains testing common-emitter characteristics for transistors.

3.4 Gummel Plot

Explains generating Gummel plots for transistors.

3.5 Current Gain

Discusses methods for measuring DC and AC current gain.

3.6 Transistor Leakage Current

Explains testing transistor leakage current.

Section 4 FET Tests

4.1 Introduction

Introduces FET testing.

4.2 Instrument Connections

Details instrument connections for FET tests.

4.3 Common-Source Characteristics

Explains common-source characteristics for FETs.

4.4 Transconductance Tests

Details transconductance testing for FETs.

4.5 Threshold Tests

Explains methods for determining FET threshold voltage.

Section 5 Using Substrate Bias

5.1 Introduction

Introduces substrate bias concepts.

5.2 Substrate Bias Instrument Connections

Details instrument connections for substrate bias.

5.3 Source-Measure Unit Substrate Biasing

Discusses SMU substrate biasing methods.

5.4 BJT Substrate Biasing

Explains substrate bias for BJTs.

Section 6 High Power Tests

6.1 Introduction

Introduces high power testing challenges.

6.1.1 Program 15 Test Configuration

Details test setup for high current tests.

6.1.2 Example Program 15: High Current Source and Voltage Measure

Shows high current sourcing with voltage measurement.

6.2 Instrument Connections

Details instrument connections for high power tests.

6.2.1 Program 16 Test Configuration

Details test setup for high voltage tests.

6.2.2 Example Program 16: High Voltage Source and Current Measure

Shows high voltage sourcing with current measurement.

Appendix A Scripts

Two-Terminal Device Scripts

Contains scripts for two-terminal device tests.

Bipolar Transistor Scripts

Contains scripts for bipolar transistor tests.

High Power Test Scripts

Contains scripts for high power tests.

FET Test Scripts

Contains scripts for FET tests.

Substrate Bias Scripts

Contains scripts for substrate bias tests.

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