Keithley Series 2600 User Manual

5-3
SECTION 5
Using Substrate Bias
3. Select the TSPLINK_CFG menu. (If the Series 2600 instru-
ments used have firmware Revision 1.4.0 or later installed,
the menu name should be TSPLINK.)
4. Select the NODE menu.
5. Set the NODE number to 2 and press ENTER.
Master: A dual-channel instrument such as the Model 2602,
2612, or 2636.
1. Press the MENU key to access MAIN MENU.
2. Select the COMMUNICATION menu. (Skip this step if
the Series 2600 instruments used have firmware Revision
1.4.0 or later installed.)
3. Select the TSPLINK_CFG menu. (If the Series 2600
instruments used have firmware Revision 1.4.0 or later
installed, the menu name should be TSPLINK.)
4. Select the NODE menu.
5. Set the NODE number to 1 for the master and press
ENTER.
6. Select the TSPLINK_CFG menu. (If the Series 2600
instruments used have firmware Revision 1.4.0 or later
installed, the menu name should be TSPLINK.)
7. Select the RESET to initialize the TSP-Link.
Turn on the computer and start Test Script Builder (TSB). 5.
Once the program has started, open a session by connecting
to the master instrument. For details on how to use TSB, see
the Series 2600 Reference Manual.
You can simply copy and paste the code from Appendix A in 6.
this guide into the TSB script editing window (Program 12),
manually enter the code from the appendix, or import the TSP
file ‘FET_ Isb_Vgs .tsp’ after downloading it to your PC.
If your computer is currently connected to the Internet, you
can click on the following link to begin downloading: http://
www.keithley.com/data?asset=50964.
Install an NPN FET such as a SD210 in the appropriate tran-7.
sistor socket of the test fixture.
Now, we must send the code to the instrument. The simplest 8.
method is to right-click in the open script window of TSB and
select ‘Run as TSP file’. This will compile the code and place
it in the volatile run-time memory of the instrument. To store
the program in non-volatile memory, see the “TSP Program-
ming Fundamentals” section of the Series 2600 Reference
Manual.
Once the code has been placed in the instrument run-time 9.
memory, we can run it at any time simply by calling the func-
tion ‘FET_Isb_Vgs()’. This can be done by typing the text
‘ FET _ Isb _ Vgs() ’ after the active prompt in the Instru-
ment Console line of TSB.
In the program ‘10. FET_ Isb_Vgs ( ).tsp’, the function FET _ Isb _
Vgs(vdssource, vsbsource,vgsstart,vgsstop,
vgssteps) is created.
vdssource • represents the voltage value on the drain-
source of the transistor
vsbsource • represents the voltage value on the
substrate-source of the transistor
I
V
I
V
Series 2600
System
SourceMeter
Channel A
Node 1
Sources V
DS
Measures I
D
I
V
Series 2600
System
SourceMeter
Channel A
Node 2
Sources V
SB
Measures I
SB
Series 2600
System
SourceMeter
Channel B
Node 1
Sweeps V
GS
V
DS
V
GS
Test
Fixture
FET
Under Test
Output HI Output HI
Output LO
Output LO
I
D
Output HI
Output LO
Figure 5-3. Program 12 test configuration

Keithley Series 2600 Specifications

General

Model	Series 2600
Measurement Functions	Voltage, Current, Resistance, Power
Resolution	Up to 6.5 digits
Current Source Range	Up to 10A
Communication Interfaces	GPIB, USB
Applications	Semiconductor testing
Category	Source Measure Unit (SMU)
Channels	Single or Dual Channel (varies by model)

Summary

Section 1 General Information

1.1 Introduction

Discusses system configurations for application programs.

1.2 Hardware Configuration

Details system hardware configuration.

1.2.1 System Configuration

Describes the overall hardware configuration of a test system.

1.2.2 Remote/Local Sensing Considerations

Discusses sensing methods for optimizing accuracy.

1.3 Graphing

Explains how to visualize data using graphing.

Section 2 Two-terminal Device Tests

2.1 Introduction

Introduces tests for two-terminal devices.

2.2 Instrument Connections

Details instrument connections for two-terminal device tests.

2.3 Voltage Coefficient Tests of Resistors

Explains testing voltage coefficient of resistors.

2.4 Capacitor Leakage Test

Details testing capacitor leakage current.

2.5 Diode Characterization

Explains diode characterization tests.

Section 3 Bipolar Transistor Tests

3.1 Introduction

Introduces bipolar transistor tests.

3.2 Instrument Connections

Details instrument connections for bipolar transistor tests.

3.3 Common-Emitter Characteristics

Explains testing common-emitter characteristics for transistors.

3.4 Gummel Plot

Explains generating Gummel plots for transistors.

3.5 Current Gain

Discusses methods for measuring DC and AC current gain.

3.6 Transistor Leakage Current

Explains testing transistor leakage current.

Section 4 FET Tests

4.1 Introduction

Introduces FET testing.

4.2 Instrument Connections

Details instrument connections for FET tests.

4.3 Common-Source Characteristics

Explains common-source characteristics for FETs.

4.4 Transconductance Tests

Details transconductance testing for FETs.

4.5 Threshold Tests

Explains methods for determining FET threshold voltage.

Section 5 Using Substrate Bias

5.1 Introduction

Introduces substrate bias concepts.

5.2 Substrate Bias Instrument Connections

Details instrument connections for substrate bias.

5.3 Source-Measure Unit Substrate Biasing

Discusses SMU substrate biasing methods.

5.4 BJT Substrate Biasing

Explains substrate bias for BJTs.

Section 6 High Power Tests

6.1 Introduction

Introduces high power testing challenges.

6.1.1 Program 15 Test Configuration

Details test setup for high current tests.

6.1.2 Example Program 15: High Current Source and Voltage Measure

Shows high current sourcing with voltage measurement.

6.2 Instrument Connections

Details instrument connections for high power tests.

6.2.1 Program 16 Test Configuration

Details test setup for high voltage tests.

6.2.2 Example Program 16: High Voltage Source and Current Measure

Shows high voltage sourcing with current measurement.

Appendix A Scripts

Two-Terminal Device Scripts

Contains scripts for two-terminal device tests.

Bipolar Transistor Scripts

Contains scripts for bipolar transistor tests.

High Power Test Scripts

Contains scripts for high power tests.

FET Test Scripts

Contains scripts for FET tests.

Substrate Bias Scripts

Contains scripts for substrate bias tests.