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Tektronix MSO4000B Series User Manual

Tektronix MSO4000B Series
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Analyze Wavefor
mData
Amplitude measurements (cont.)
Measurement Description
RMS The true Root Mean Square voltage over the entire waveform or gated region.
Cycle RMS The true Root Mean Square voltage over the rst cycle in the w aveform or the rst
cycle in the gated region.
Miscellaneous measurements
Measurement Description
Rising Edge
Count
The number of positive transitions from the low reference value to the high reference
value in the waveform or gated region.
Falling Edge
Count
The number of negative transitions from the high reference value to the low reference
value in the waveform or gated region.
Positive Pulse
Count
The number of positive pulses that rise above the mid reference crossing in the waveform
or gated region.
Negative Pulse
Count
The number of negative pulses that fall below the mid reference crossing in the waveform
or gated region.
Area Area measurement is a voltage over time measurement. It returns the area over the
entire waveform or gated region in volt-seconds. Area measured above ground is
positive; area measured below ground is negative.
Cycle A rea A voltage over time measurement. The measurement is the area over the rst cycle
in the waveform or the rst c ycle in the gated region expressed in volt-seconds. The
area above the common reference point is positive, and the area below the common
reference point is negative.
Histogram measureme
nts
Measurement Description
Waveform
Count
Displays the number
of waveforms that contributed to the histogram.
Hits in Box
Displays the number of samples within the histogram box or on its boundaries.
Peak Hits
Displays the number of samples in the bin that contains the most hits.
Median
Displays the middle histogram data value, where half of all histogram data points are
less than this value and half are greater than this value.
108 MSO4000B and DPO 4000B Series Oscilloscopes User Manual

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Tektronix MSO4000B Series Specifications

General IconGeneral
BrandTektronix
ModelMSO4000B Series
CategoryTest Equipment
LanguageEnglish

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