5-12
9845B/C Diagnostics
k7 Rewind TIS
Pressing
(}L)
rewinds a tape cartridge installed
in
the right-hand cartridge drive (TIS).
k8 Read/Write Memory Troubleshooter
This test allows you to select specific memory tests. If the SHIFT LOCK key
is
down, the test
will
not stop
on
an error.
More than
one
test can be selected. Here
is
a list of the available tests and the key to press to
select each test.
The
[j=:J
,
CD
,
CD
and
UJ
keys select different memory tests. Pressing the
CD
key enters the
"peek
and
poke" portion of the memory troubleshooter program. Peek and
poke
is
described at the
end
of this test description.
Press
Test
Marching Pattern - A test pattern
is
stored
in
memory. The first word
is
read
and
verified
and
the complement of the test pattern
is
stored
in
the first word. This sequence
is
continued for every word
in
the block
of memory.
Once the pattern has been "walked
up"
memory, its
complement
is
walked down. The marching pattern test walks up
and
down six different patterns. This test verifies that ones
and
zeros can
be stored
in
all
memory cells,
and
checks for opens
and
shorts
in
data
bus lines.
Refresh - Zeros are stored
in
memory. The memory
is
left alone for
ten seconds
and
then verified. Ones are then stored
in
memory
and
the sequence repeated. This test checks the refresh circuitry.
Byte - Zeros are stored
in
memory. Ones are then stored in the
right-byte using the byte operation. Memory
is
then verified. Zeros are
stored
in
memory
and
ones are stored
in
the left byte. Memory
is
verified. The sequence
is
then repeated with ones stored
in
memory
and
zeros stored
in
left and right bytes. This test checks memory byte
operations.
Walking bit (ones and zeros) - Every cell
in
a byte half block of
memory
is
set to zero. A one
is
written
in
the
first
cell, and
all
other
cells are read to verify that
it
is
still
one. The tested cell
is
then restored
to a zero
and
the next cell
is
set to a one.
All
cells are again read to
verify their contents. The sequence
is
continued for every
cell
in the
block.
Its
complementary pattern walking zeros completes the test.
Each 64k block
is
tested, 32k bytes at a time. This test checks for
memory cell row
and
column interactions. This test takes about six
hours to test each 64k byte block of memory.
Select the tests
in
the order you want them to run; then press (
CONTINUE).
If no tests are speCified
all
the tests
will
be
run.
Enter the octal block address of the memory block to be tested
and
press
(CONTINUE).
If
the
specified block
is
not present,
BLK
NOT
PRESENT
is
displayed. Press
(CONTINUE)
to enter
another block address.
If
no block address
is
entered, the default
is
to test
all
blocks of memory.
Press
C!:J to test
all
blocks.
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