S530/S540 KTE Linear Parametric Test Library (LPTLib) User's Manual Section 2: Lin
ear Parametric Test Library
S530-900-01 Rev. E / September 2017 2-7
Because of the slow speed of GPIB communication and the order in which instruments are cleared,
do not use GPIB instruments when performing bsweepX tests.
Multiple GPIB interfaces are not currently supported. However, future systems may support multiple
interfaces.
Instruments and instrument drivers
The Linear Parametric Test Library (LPTLib) provides the lowest level of instrument control available,
though it does not control the hardware directly. Instead, LPTLib relies on hardware drivers to control
instruments.
Each of these drivers only supports LPTLib commands appropriate for their function. For example,
the driver for a voltmeter would not support the function to measure frequency. The following tables
provide information about which LPTLib commands are supported by the driver for each type
instrument.
The following commands are supported by all drivers:
•
•
The following commands are supported by source-measure unit (SMU) drivers:
•
• asweepX
• avgi, avgv (avgX)
• bmeasX
• bsweepX
• clrscn
• clrtrg
• devclr
• forcei, forcev (forceX)
• getstatus
• insbind
•
,
(
X)
•
• lorangeX
• measi, measv (measX)
• pulseX
• rangei, rangev (rangeX)
• refctrl
• rtfary
• rttrigary (26xx only)
• savgi, savgv (savgX)
• searchX
• setauto
•
• setmode
• setvmtr (26xx only)
• sintgi, sintgv (sintgX)
• smeasi, smeasv (smeasX)
• sweepi, sweepv (sweepX)
• trigig, trigtg, trigvg
(trigXg)
• trigil, trigtl, trigvl
(trigXl)
• tstsel
The following commands are supported by capacitance-voltage unit (CVU) drivers:
• avgc, avgcg, avgg (avgX)
• clrscn
• devclr
• forcev
•
•
• intgc, intgcg, intgg
(intgX)
• measc, meascg, measg
(
X)
•
• rtfary
• setauto
• setmode
•
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