Keithley S530 User Manual

S530/S540 KTE Linear Parametric Test Library (LPTLib) User's Manual Section 3:
LPTLib command reference
S530-900-01 Rev. E / September 2017 3-15
bsweepX
This command supplies a series of ascending or descending voltages or currents and shuts down the source
when a trigger condition is encountered.
Usage
int bsweepi(int instr_id, double startval, double endval, unsigned int num_points,
double delay_time, double *result);
int bsweepv(int instr_id, double startval, double endval, unsigned int num_points,
double delay_time, double *result);
instr_id
The instrument identification code of the sourcing instrument;
SMU
n,
CMTR
n,
PSRC
n
startval
The initial voltage or current level applied as the first step in the sweep; this value
can be positive or negative
endval
The final voltage or current level applied as the last step in the sweep; this value
can be positive or negative
num_points
The number of separate current and voltage force points between the startval
and
endval
parameters (1 to 8,000)
delay_time
The delay in seconds between each step and the measurements defined by the
active measure list
result
Assigned to the result of the trigger; this value represents the source value applied
at the time of the trigger or breakdown
Details
The bsweepX command is used with the trigXg or trigXl command. These trigger commands
provide the termination point for the sweep. At the time of trigger or breakdown, all sources are shut
down to prevent damage to the device under test. Typically, this termination point is the test current
required for a given breakdown voltage.
Once triggered, the bsweepX command terminates the sweep and clears all sources by executing a
devclr command internally. The standard sweepX command continues to force the last value. This
is useful for device characterization curves but can cause problems when used in device breakdown
conditions.
The bsweepX command can also be used with the smeasX, sintgX, savgX, or rtfary command.
Measurements are stored in a one-dimensional array in the consecutive order in which they were
made.
The system maintains a measurement scan table consisting of devices to test. This table is
maintained using calls to the smeasX, sintgX, savgX, or clrscn command. As multiple calls to
sweepX commands are made, these commands are appended to the measurement scan table.
Measurements are made after the time programmed by the delay_time parameter has elapsed at
the beginning of each bsweepX command step.
When multiple calls to the bsweepX command are executed in the same test sequence, the arrays
defined by calls to the smeasX, sintgX, or savgX command are all loaded sequentially. The results
from the second call to the bsweepX command are appended to the results of the previous bsweepX
command call. This can cause access violation errors if the arrays were not dimensioned for the
absolute total. The measurement scan table remains intact until a devint or clrscn command
completes.

Keithley S530 Specifications

General

Brand	Keithley
Model	S530
Category	Test Equipment
Language	English