Keithley S530 User Manual

Section
3: LPTLib command reference S530/S540 KTE Linear Parametric Test Library (LPTLib) User's Manual
3-16 S530-900-01 Rev. E / September 2017
Defining new test sequences using the smeasX, sintgX, or savgX command adds the command to
the active measure list. The previous measures are still defined and used; however, previous
measures for the second sweep can be eliminated by calling the clrscn command. New measures
are defined and used by calling the smeasX, sintgX, or savgX command after a clrscn command.
Example
double bvdss;
.
.
conpin(SMU1, 1, 0);
conpin(GND, 2, 3, 0);
limiti(SMU1, 100e-6); /* Define the I limit for the device. */
rangei(SMU1, 100e-6); /* Select a fixed range */
/* measurement. */
trigil(SMU1, -10e-6); /* Set the trigger point to -10 uA. */
bsweepv(SMU1, 10.0, 50.0, 40, 10.0e-3, &bvdss); /* Sweep */
/* from 10 V to 50 V in 40 */
/* steps with 10 ms settling */
/* time per step. */
This example measures the drain to source breakdown voltage of a field-effect transistor (FET). A linear
voltage sweep is generated from 10.0 V to 50.0 V by SMU1 using the bsweepv command. The breakdown
current is set to 10 mA by using the trigil command. The voltage at which this current is exceeded is
stored in the variable bvdss.
Also see
clrscn (on page 3-17)
devclr (on page 3-26)
rtfary (on page 3-63)
savgX (on page 3-64)
sintgX (on page 3-82)
smeasX (on page 3-84)
sweepX (on page 3-88)
trigXg, trigXl (on page 3-91)

Keithley S530 Specifications

General

Brand	Keithley
Model	S530
Category	Test Equipment
Language	English