Keithley S530 User Manual

S530/S540 KTE Linear Parametric Test Library (LPTLib) User's Manual Section 3:
LPTLib command reference
S530-900-01 Rev. E / September 2017 3-5
Combination commands
Command Description
asweepX (on page 3-8)
Sweep with a user-defined force array (i, v).
bmeasX (on page 3-13)
Block measurement; take a series of readings as quickly as
possible (i, v).
bsweepX (on page 3-15)
Sweep and shutdown source if device meets trigger condition
(i, v).
clrscn (on page 3-17)
Clear any sweep measurements.
clrtrg (on page 3-19)
Clear any set triggers.
mpulse (on page 3-47)
Force a pulse and measure voltage and current.
rtfary (on page 3-63)
Return forced array after sweep.
savgX (on page 3-64)
Average each point of associated sweep (i, v).
searchX (on page 3-71)
Search for a specific current or voltage.
sintgX (on page 3-82)
Integrate each point of associated sweep (i, v).
smeasX (on page 3-84)
Measure each point of associated sweep (i, t, v).
sweepX (on page 3-88)
Sweep a specified range of current or voltage.
trigXg, trigXl (on page 3-91) Trigger if a measurement is greater than a specific value
(i, t, v).
Trigger if a measurement is less than a specific value (i, t, v).
Timing commands
Command Description
adelay (on page 3-8)
Specify an array of delay points to use in a sweep.
delay (on page 3-24)
Set a user-defined delay in a test sequence (in milliseconds).
disable (on page 3-28)
Disable the timer.
enable (on page 3-28)
Initialize and start the timer.
imeast (on page 3-32)
Read the timer (immediate measure time).
rdelay (on page 3-62)
Set a user-defined delay (in seconds).
GPIB commands
Command Description
kibdefclr (on page 3-36)
Clear instrument on devclr command.
kibdefint (on page 3-37)
Clear instrument on
delay
command.
kibrcv (on page 3-38)
Read device-dependent string.
kibsnd (on page 3-39)
Send device-dependent command.
kibspl (on page 3-40)
Serial poll an instrument.
kibsplw (on page 3-41)
Synchronous serial poll an instrument.

Keithley S530 Specifications

General

Brand	Keithley
Model	S530
Category	Test Equipment
Language	English