Keithley S530 User Manual

Section
3: LPTLib command reference S530/S540 KTE Linear Parametric Test Library (LPTLib) User's Manual
3-12 S530-900-01 Rev. E / September 2017
Example
double ciss;
.
.
conpin(CMTR1L, 3, 0);
conpin(CMTR1H, 2, 0);
rangec(CMTR1, 2.0E-12); /* Select range for 2.0 pF. */
avgc(CMTR1, &ciss, 10, 2.0E-3); /* Measure capacitance ten */
/* times with 2 ms between each;*/
/* return average of results to*/
/* ciss. */
This example shows a test sequence used to measure the capacitance between a MOSFET gate and
substrate. The capacitance returned is the result of ten measurements, each separated by 2 ms.
Equation 1: S530/S540 capacitance between MOSFET gate and substrate
Also see
measX (on page 3-45)
rangeX (on page 3-60)

Keithley S530 Specifications

General

Brand	Keithley
Model	S530
Category	Test Equipment
Language	English