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Agilent Technologies InfiniiVision 3000 X-Series User Manual

Agilent Technologies InfiniiVision 3000 X-Series
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200 Agilent InfiniiVision 3000 X-Series Oscilloscopes User's Guide
12 Acquisition Control
When capturing multiple infrequent trigger events it is advantageous to
divide the oscilloscope's memory into segments. This lets you capture
signal activity without capturing long periods of signal inactivity.
Each segment is complete with all analog channel, digital channel (on MSO
models), and serial decode data.
When using segmented memory, use the Analyze Segments feature (see
"Measurements, Statistics, and Infinite Persistence with Segmented
Memory" on page 201) to show infinite persistence across all acquired
segments. See also "To set or clear persistence" on page 133 for details.
To acquire to
segmented
memory
1 Set up a trigger condition. (See Chapter 10, “Triggers,” starting on page
143 for details.)
2 Press the [Acquire] key in the Waveform section of the front panel.
3 Press the Segmented softkey.
4 In the Segmented Memory Menu, press the Segmented softkey to enable
segmented memory acquisitions.
5 Press the #ofSegs softkey and turn the Entry knob to select the
number of segments into which you would like to divide the
oscilloscope's memory.
Memory can be divided into as few as two segments and as many as
1000 segments, depending on the oscilloscope model.
6 Press the [Run] or [Single] key.
The oscilloscope runs and fills a memory segment for each trigger event.
When the oscilloscope is busy acquiring multiple segments, the progress is
displayed in the upper right area of the display. The oscilloscope
continues to trigger until memory is filled, then the oscilloscope stops.
If the signal you are measuring has more than about 1 s of inactivity,
consider selecting the Normal trigger mode to prevent AutoTriggering. See
"To select the Auto or Normal trigger mode" on page 180.

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Agilent Technologies InfiniiVision 3000 X-Series Specifications

General IconGeneral
BrandAgilent Technologies
ModelInfiniiVision 3000 X-Series
CategoryTest Equipment
LanguageEnglish

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