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Keithley 2470 User Manual

Keithley 2470
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Model 2470
High Voltage SourceMeter Instrument User's Manual Section 6: Measure I-
V characteristics of FETs
2470-900-01 Rev. A / May 2019 6-9
Send the following commands for this example application:
SMU 1,
SMU 2, or
pseudocode
Commands Description
SMU 1
*RST
:SENS:FUNC "CURR"
:SENS:CURR:RANG:AUTO ON
:ROUT:TERM REAR
:SOUR:FUNC VOLT
:SOUR:VOLT:RANG 20
:SOUR:CONF:LIST:CRE "stepVals"
:DIG:LINE1:MODE TRIG, OUT
:DIG:LINE2:MODE TRIG, IN
:TRIG:DIG1:OUT:STIM NOT1
:TRIG:DIG2:IN:CLE
:TRIG:DIG2:IN:EDGE RIS
Reset the instrument.
Set to measure current.
Set to measure with autorange
enabled.
Set to rear terminals.
Set to source voltage.
Set to 20 V source range.
Create a source configuration list
called stepVals.
Set digital line 1 to trigger out.
Set digital line 2 to trigger in.
Set the stimulus for digital line 1 to
the notify1 event.
Clear digital line 2.
Set to detect rising edge on line 2.
Pseudocode
for i = 2 to 5 do:
Set up a
for
loop from 2 to 5.
SMU 1
:SOUR:VOLT i
:SOUR:CONF:LIST:STORE "stepVals"
Set the voltage level to the iteration
number.
Store the source configuration to
stepVals
.
Pseudocode
end for
End the
for
loop.
SMU 1
:TRIG:BLOC:CONF:RECALL 1, "stepVals"
:TRIG:BLOC:SOUR:STAT 2, ON
:TRIG:BLOC:MEAS 3
:TRIG:BLOC:NOT 4, 1
:TRIG:BLOC:WAIT 5, DIG2
:TRIG:BLOC:CONF:NEXT 6, "stepVals"
:TRIG:BLOC:BRAN:COUN 7, 4, 3
:TRIG:BLOC:SOUR:STAT 8, OFF
Create trigger model block 1 to load
stepVals at the first index.
Create block 2 to turn the output on.
Create block 3 to make a
measurement.
Create block 4 to generate the
notify1 event.
Create block 5 to wait on digital line
2.
Create block 6 to load the next
index of stepVals.
Create block 7 to branch to block 3,
3 times.
Create block 8 to turn the output off.

Table of Contents

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Keithley 2470 Specifications

General IconGeneral
BrandKeithley
Model2470
CategoryPower Supply
LanguageEnglish

Summary

Safety Precautions

Introduction

Welcome

Welcomes the user and introduces the Model 2470 High Voltage SourceMeter Instrument.

Introduction to this manual

Explains the manual's content, purpose, and structure for using the Keithley 2470.

Extended Warranty Information

Provides details on purchasing additional warranty coverage for the instrument.

Contact Information

Offers contact details for support, sales, and general inquiries about the instrument.

Organization of Manual Sections

Outlines the structure and content of the user manual's various sections.

Instrument Application Examples

Describes example applications for the Model 2470, including measurements and FET testing.

Front-panel overview

Powering the Instrument On or Off

Steps to connect the power cord and turn the instrument on or off.

Front-Panel Controls Overview

Details the instrument's physical controls, keys, terminals, and indicators.

Controlling the Output ON/OFF

Procedures for turning the instrument's output source on or off.

Touchscreen Display and Interaction

Explains the operation, navigation, and features of the touchscreen display.

Menu Structure Overview

Details the instrument's main menu system, submenus, and options.

Storing Measurements on USB

Instructions for saving measurement data from buffers to a USB flash drive.

Saving Screen Captures to USB

Guidance on capturing and saving instrument screen images to a USB drive.

Using a remote interface

Remote Communications Interfaces

Overview of available interfaces (LAN, USB, GPIB, TSP-Link) for remote control.

Supported Remote Interfaces

Lists the specific remote communication interfaces supported by the 2470.

GPIB Communications Setup

Instructions for installing drivers and connecting via GPIB.

LAN Communications Setup

Steps to configure and use LAN for instrument communication.

USB Communications Setup

Guide to connecting and communicating with the instrument via USB.

Accessing the Web Interface

How to connect to and use the instrument's web interface via a browser.

LAN Troubleshooting Suggestions

Tips for resolving common issues encountered with LAN connectivity.

Identifying the Instrument

Method to locate and identify the specific instrument on the network.

Determining the Command Set to Use

Explains how to select between SCPI and TSP command sets for control.

Making basic front-panel measurements

Introduction to Front-Panel Measurements

Overview of performing measurements directly on the instrument's front panel.

Equipment Required for Front-Panel Measurements

Lists the necessary hardware and test components for front-panel tests.

Device Connections for Front-Panel Measurements

Instructions for connecting the device under test (DUT) for front-panel measurements.

Performing Front-Panel Measurements

Step-by-step guide to taking measurements using the instrument's front panel interface.

Leakage current and insulation resistance

Introduction to Leakage and Insulation Tests

Explains the principles of measuring leakage current and insulation resistance.

Equipment Required for Leakage/Insulation Tests

Lists the necessary equipment for performing leakage and insulation tests.

Setting Up Remote Communications for Tests

Guidance on configuring remote interfaces for leakage and insulation tests.

Device Connections for Leakage/Insulation Tests

Describes how to connect the DUT for leakage and insulation resistance measurements.

Measuring Leakage Current

Detailed steps for measuring capacitor leakage current using the instrument.

Measuring Insulation Resistance

Steps for measuring insulation resistance of cables and connectors.

Measure I-V characteristics of FETs

Introduction to FET I-V Characterization

Overview of testing Field-Effect Transistors (FETs) using the instrument.

Equipment Required for FET Testing

Lists the hardware needed for characterizing FETs with the 2470.

Setting Up Remote Communications for FETs

Instructions for remote setup and connecting multiple instruments for FET tests.

Setting Up External Hardware Triggers for FETs

How to synchronize multiple instruments for FET testing using triggers.

Device Connections for FET Measurements

Describes the necessary connections for various FET measurement configurations.

Remote FET Testing using SCPI Commands

Using SCPI commands to generate I-V curves for FETs.

Remote FET Testing using TSP Commands

Using TSP commands for FET I-V characterization and subthreshold swing measurements.

Troubleshooting FAQs

About This Troubleshooting Section

Introduces the troubleshooting section and refers to additional FAQs.

Finding Updated Instrument Drivers

How to locate and download the latest drivers for the instrument.

Upgrading Instrument Firmware

Instructions for updating the instrument's firmware via USB.

USB Flash Drive Recognition Issues

Troubleshooting problems with the instrument recognizing USB flash drives.

Changing the Instrument Command Set

Guide to switching between SCPI and TSP command sets.

Understanding Event Code 5074

Explains the meaning and resolution of event code 5074 related to the interlock.

Saving and Recalling Instrument State

How to save instrument settings as a script and recall them.

Troubleshooting Setting Changes

Explains why instrument settings might change unexpectedly based on active functions.

Quick Setup Options Explained

Overview and usage of the instrument's Quick Setup feature.

Next steps

Additional 2470 Information Resources

Points to further documentation, handbooks, application notes, and support.

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