6: Measure I-V characteristics of FETs Model 2470 High Voltage SourceMeter Instrument
6-8 2470-900-01 Rev. A / May 2019
The following figure shows the connections from the rear-panel terminals of both 2470s to the FET.
Figure 34: Two 2470s set up to test a three-terminal FET
Remote control of FET testing using SCPI commands
The two example sequences of SCPI commands for this application generate a drain family of curves
on a FET using two 2470 instruments. One of the examples uses the trigger model to generate the
family of curves. The other example uses a linear sweep. You may need to make modifications for
operation in your programming environment.
Set up the application using SCPI commands with the trigger
model
In this application, the gate voltage steps from 2 V to 5 V in 1 V steps, the drain voltage sweeps from
0 V to 5 V in 51 steps, and the drain current is measured. The current and voltage measurements are
stored in defbuffer1. The 2470 trigger model synchronizes the two 2470 instruments.
You send commands to either the sweeper on the drain (SMU 1) or the stepper on the gate (SMU 2).
In the table, commands for the sweeper have a light gray background. Commands for the stepper
have a darker gray background. The light-brown shaded code represents pseudocode that will vary
depending on the programming environment you use. Each bulleted item in the Description column
describes a single line of code in the Commands column.
To Next Page
Loading...
Need help?
General
