Keithley S530 User Manual

Section
3: LPTLib command reference S530/S540 KTE Linear Parametric Test Library (LPTLib) User's Manual
3-90 S530-900-01 Rev. E / September 2017
Example
double resi[11], ssbiasv;
.
.
conpin(SMU1, 1, 0);
conpin(SMU2, 2, 0);
conpin(SMU3, 3, 0);
conpin(GND, 4, 0);
forcev(SMU3, ssbiasv); /* Apply substrate bias */
/* voltage ssbiasv. */
forcev(SMU1, -.1); /* Apply a gate-to-source */
/* voltage of -0.1 V. */
smeasi(SMU2, resi); /* Perform a series of current */
/* measurements; return */
/* the results to the array */
/* resi. */
sweepv(SMU2, 0.0, 5.0, 10, 2.5E-3); /* Generate */
/* 11 steps and 11 */
/* points each 2.5 ms duration, */
/* ranging from 0 V to 5V. */
This example gathers data to create a graph showing the common drain-source characteristics of a
field-effect transistor (FET). A fixed gate-to-source voltage is generated by SMU1. A voltage ramp from 0 V
to 5 V is generated by SMU2. Drain current applied by SMU2 is measured 11 times by the smeasi
command. Data is stored in the array resi.

Keithley S530 Specifications

General

Brand	Keithley
Model	S530
Category	Test Equipment
Language	English