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Tektronix 475 Technical Manual

Tektronix 475
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TM 11-6625-2735-14-1
3. Advance the INTENSITY control until the display is
visible. If the display is not visible with the INTENSITY
control at midrange, press the BEAM FINDER pushbutton
and adjust the CH 1 VOLTS/DIV switch until the display is
reduced in size vertically; then center the compressed
display with the vertical and horizontal POSITION con-
trols; release the BEAM FINDER pushbutton. Adjust the
FOCUS control for a well-defined display.
4. Set the CH 1 VOLTS/DIV switch and CH 1
POSITION control for a display that remains in the display
area vertically.
5. Adjust the A Trigger LEVEL control for a stable
display.
6. Set the TIME/DIV switch and the horizontal
POSITION control for a display that remains in the display
area horizontally.
Magnified Sweep Display
1. Preset the instrument controls and follow steps 1
through 6 for obtaining a Normal Sweep Display.
2. Adjust the horizontal POSITION control to move the
area to be magnified to within the center graticule division
of the crt. If necessary, change the TIME/DIV switch
setting so the complete area to be magnified is within the
center division.
3. Set the X10 MAG switch to the on position (button
in) and adjust the horizontal POSITION control for precise
positioning of the magnified display. Divide the TIME/DIV
setting by 10 to determine the magnified sweep rate.
Delayed Sweep Displays
1. Preset the instrument controls and follow steps 1
through 6 for obtaining a Normal Sweep Display.
2. Set the HORIZ DISPLAY switch to A INTEN and the
B Trigger SOURCE switch to STARTS AFTER DELAY.
3. Pull out the B TIME/DIV switch knob and turn
clockwise so the intensified zone on the display is the
desired length. Adjust the INTENSITY control to achieve
the desired display brightness.
4. Adjust the DELAY TIME POSITION dial to position
the intensified zone to the portion of the display to be
delayed.
5. Set the HORIZ DISPLAY switch to B DLYD. The
intensified zone on the display noted in step 3 is now being
displayed in delay form. The delayed sweep rate is
indicated by the line on the B TIME/DIV switch knob.
6. For a delayed sweep display that will exhibit less
jitter, set the B Trigger SOURCE switch to the same
position as the A Trigger SOURCE switch and adjust the B
Trigger LEVEL control for a stable display. If the A Trigger
SOURCE switch is in the LINE position, a sample of the
line voltage will have to be supplied to the B Trigger circuit
externally.
Mixed Sweep Display
1. Preset the instrument controls and follow steps 1
through 6 for obtaining a Normal Sweep Display.
2. Pull out the B TIME/DIV switch knob and turn
clockwise to the desired sweep rate. Adjust the lNTEN-
SITY control to achieve the desired display brightness.
3. Set the HORIZ DISPLAY switch to MIX. The crt
display now contains more than one time factor on the
horizontal axis. The first portion of the display is at the A
Time Base sweep rate and the latter part is at the B Time
Base sweep rate. The start of the B Time Base portion of
the display can be changed by adjusting the DELAY TIME
POSITION control.
X-Y Display
1. Preset the instrument controls and turn the instru-
ment power on. Allow several minutes for instrument
warm-up.
2. Set the TIME/DIV switch to X-Y and the VERT
MODE to CH 2. Apply the vertical signal to the CH 2 OR Y
input connector and the horizontal signal to the CH 1 OR X
input connector. The CH 2 POSITION control will provide
vertical positioning and the CH 1 POSITION control will
provide horizontal positioning.
3. Advance the INTENSITY control until the display is
visible. If the display is not visible with the INTENSITY
control at midrange, press the BEAM FINDER push button
and adjust the CH 1 and CH 2 VOLT/DIV switches until
the display is reduced in size both vertically and horizon-
tally; then center the compressed display with the
POSITION controls; release the BEAM FINDER pushbut-
ton. Adjust the FOCUS control for a well-defined display.
2-9/(2-10 blank)

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Tektronix 475 Specifications

General IconGeneral
BrandTektronix
Model475
CategoryTest Equipment
LanguageEnglish

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