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HP 1630A User Manual

HP 1630A
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Model
1630A/D/G

General
Information
INTERNAL
STORAGE
The
1630G
has
the
added
feature
of
an
internal
storage
spacewhich
allows
the
user
to
store
menu
configurations
and
an
inverse
assembler
.
One
configuration
of
each
menu
and
one
inverse
assembler
maybe
stored
at
one
time
.
The
stored
configurations
and
inverse
assemblers
may
be
specified
for
automatic
loading
at
power-up
of
the
1630G
.
THE
SYSTEM
SPECIFICATION
Use
the
menus
in
this
specification
to
identify
how
the
analyzer
will
be
used
:
whether
as
a
state
analyzer,
a
timing
analyzer
(with
or
without
glitch
capture),
or
a
combined
state
and
timing
analyzer
.
In
this
menu,
you
also
identify
the
waythe
analyzer
will
operate
when
used
as part of
a
system,
or
when
using
capabilities
offered
by
accessories
.
THE
FORMAT
SPECIFICATION
Use
the
menus
in
this
specification
to set
up
the
way
the
analyzer
formulates
displays
from
its
captured
information
.
You
can
label
individual
bits
or sets
of
bits,
and
assign
names
to
identify
address
ranges
and/or
specific
values
found
in
those
labeled
sets
.
The
analyzerwill
compose
displays
using
your
labels
and
names,
if
desired
.
THE
TRACE
SPECIFICATION
Use
the
menus
in
this
specification
to
enter
parameters
for
making
your
measurements
.
You
can
set
up
the
analyzer
to
trace
state
flow
and/or
record
electrical
activity at
nodes
in
a
system
under
test
.
The
analyzer
can
also
perform
overview
measurements
to
gauge
the
efficiency of
selected
software
routines
.
LIST
DISPLAYS
The
analyzer
composes
lists
of
information
captured
from
labeled
sets
of bits
.
These
lists
show
a series of
soft-
ware
executions,
and/or
a
sequence
of
electrical
activities
at
nodes
in
a
system
under
test
.
Valuesshown
in
these
lists
can
be
expressed
using
names
of
your
choice,
as
well
as
using
numbers
in
the
binary,
octal,
decimal,
and
hexadecimal
number
bases
.
Values
can
also
be
expressed
as
ASCII
codes
for
labels
having
from
6
to
16
bits
.
WAVEFORM
DISPLAYS
The
waveform
display
shows
up
to
16
individual
traces
of
electrical
activity
on
selected
bits
.
Each
trace
is
shown
as
a
continuous
line
of
high
and
low
states
.
The
waveform
shows
how
the
states
changed
with
time
at
each
monitored
point
.
You
can
also
see
points
on
the traces
where
glitches
were
detected
during
the
measurement,
if
desired
.
Glitch
detection
is
accomplished
by
internally
combining
two
timing
channels
attached
to
a
single
probe,
using
one
channel
for
data
values,
and
using
one
of
the
channels
as
a
glitch
detector
.
CHART
DISPLAYS
The
analyzer
can
format
two
types
of
chart
displays
:
XY
charts,
and
histograms
.
XY
charts
show
a plot of
the
flow
of
values
on
a
labeled
set of
bits
.
You
can
control
the
horizontal
and
vertical
scales
of
the
chart
to
examine
the
details
around
areas
of
interest
on
the
XY
chart
.
Histogram
charts
are
bar
graphs
used
to
measure
the
performance
of
software
modules
in
a
system
under
test
.
The
analyzer
can
show
two
types
of
histograms
:
state label
histograms,
and
time
interval
histograms
.
A
state
label
histogram
shows
the
relative
number
of
executions
within
each
range
of
states
you
define
.
Up
to
eight
ranges
of
states
can
be
defined
for
a
label
histogram
.
Time
interval
histograms
show
eight
time
ranges
;
you
can
define
the
period
of
each
range
.
You
can
set
up
the
analyzer
to
make
time
interval
measurements
each
time
the
software
executes
from
one
selected
point
to
another
in
the
system
under
test
.
The
time
interval
histogram
shows
how
often
execution
of
the
selected
software
module
was
completed
within
each
of
the
time
ranges
you
defined
.

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HP 1630A Specifications

General IconGeneral
BrandHP
Model1630A
CategoryMeasuring Instruments
LanguageEnglish

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