Datasheet 21
Electrical Specifications
2.5.3 V
CC
Overshoot
The processor can tolerate short transient overshoot events where V
CC
exceeds the VID
voltage when transitioning from a high to low current load condition. This overshoot
cannot exceed VID + V
OS_MAX
(V
OS_MAX
is the maximum allowable overshoot voltage).
The time duration of the overshoot event must not exceed T
OS_MAX
(T
OS_MAX
is the
maximum allowable time duration above VID). These specifications apply to the
processor die voltage as measured across the VCC_SENSE and VSS_SENSE lands.
NOTES:
1. V
OS
is measured overshoot voltage.
2. T
OS
is measured time duration above VID.
2.5.4 Die Voltage Validation
Overshoot events on processor must meet the specifications in Table 6 when measured
across the VCC_SENSE and VSS_SENSE lands. Overshoot events that are < 10 ns in
duration may be ignored. These measurements of processor die level overshoot must
be taken with a bandwidth limited oscilloscope set to a greater than or equal to
100 MHz bandwidth limit.
Table 6. V
CC
Overshoot Specifications
Symbol Parameter Min Max Unit Figure Notes
V
OS_MAX
Magnitude of V
CC
overshoot above VID — 50 mV 2
1
NOTES:
1. Adherence to these specifications is required to ensure reliable processor operation.
T
OS_MAX
Time duration of V
CC
overshoot above
VID
—25μs 2
1
Figure 2. V
CC
Overshoot Example Waveform
Example Overshoot Waveform
0 5 10 15 20 25
Time [us]
Voltage [V]
VID - 0.000
VID + 0.050
V
OS
T
OS
T
OS
: Overshoot time above VID
V
OS
: Overshoot above VID
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