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GE MFE DMS 2 User Manual

GE MFE DMS 2
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4. Measuring Thickness
DMS 2 Operating Manual Page 111
Step 4:
Press below the selection titled LAST R. You’ll
note that the following two options are available:
HOLD—The thickness value will continue to be
displayed, but it’s appearance will change to “hollow”
lettering, when the probe is uncoupled.
BLANK—The thickness value won’t be displayed when
the probe is uncoupled. Instead, a row a dashes will be
displayed.
Step 5:
The uncoupled thickness display will be set to the
configuration last chosen, until the next time the instrument
is powered on or a P-set is stored.
NOTE:
Each time the instrument is powered on or a P-set is
stored, the LAST R setting will revert to the default of HOLD.
4.4 Adjusting the A-scan Display
When properly set up, the A-scan display shows the sound
wave (or echo) signals that are used to determine the
thickness measurement. This section describes the various
ways in which the A-scan display can be modified.
Note that the DMS 2 is designed to automatically configure
the A-scan display based on information collected during the
calibration and probe-zeroing processes. (Refer to Sections
3.3.3 and 3.3.4.) Most users will find that the A-scan display
won’t need to be adjusted in most applications. In fact, it’s
typical that the operator will lock the instrument following
initial calibration and A-scan adjustment. This prevents
unintentional changes to A-scan configuration. See Section
3.3.5 to lock and unlock the instrument.
Failure to properly perform calibration and probe zeroing
procedures, or poor probe-to-material coupling may result in
the continued need to adjust the A-scan display.
NOTE:
In DUAL and SIP modes, all measurements are
made to the flank of the triggered echo; that is, the intersec-
tion of the leading (left) edge of the echo signal and the gate
bar. In D-MULTI and S-PEAK modes, measurements are
made between the peaks of the two triggered backwall
echoes. Peak measurement isn’t affected by the amplitude
and shape of the echoes. In S-FLANK mode, measurements
are made between the flanks of the two triggered backwall
echoes.
4.4.1 How the A-scan Display can be Modified
The appearance of the A-scan display can be modified to
improve visibility, adjust for differences in individual signals,
and to match operator preference. Normally, the A-scan

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GE MFE DMS 2 Specifications

General IconGeneral
BrandGE
ModelMFE DMS 2
CategoryMeasuring Instruments
LanguageEnglish

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