Nikon eclipse Ci-L User Manual

Chapter 1 Microscopy Procedures
21
Microscopy Procedures
Sensitive Tint Plate Microscopy
Chapter 1-4
4
Sensitive Tint Plate Microscopy
4.1
System Configuration and Controls
This section explains an example system configuration and the controls required for sensitive polarization microscopy
using the ECLIPSE Ci-S/Ci-L.
Names of components are denoted in the following manner: [Polarizer unit for first-order red compensation].
CLAMP
TORQUE
ND4
ND8
OUT
IN
ND4
ND8
OUT
IN
DSC
MODEL ECLIPSE Ci-S
NIKON CORPORATION
TOKYO, JAPAN
100–240V~
0.9A
50/60Hz
MADE IN CHINA
This device complies with Part 15 of the FCC
Rules. Operation is subject to the following two
conditions:
(1) this device may not cause harmful interference,
and (2) this device must accept any interference
received, including interference that may cause
undesired operation.
This Class A digital apparatus complies with
Canadian ICES-003.
Cet appareil numérique de la classe A est
confirme à la norme NMB-003 du Canada.
940001
4N75
INSPECTION
EQUIPMENT
70
60
50
40
30
20
10
0
90
80
Condenser focus knob
Dia-illumination
brightness control knob
Grip
Condenser centering
screw
AC inlet
Input voltage
label
[Eyepiece]
[Objective]
[Stage]
[Polarizer unit for
first-order
red com
p
ensation
]
[Tube]
[Nosepiece]
[Main unit]
(The figure shows
ECLIPSE Ci-S.)
Diopter adjustment ring
Coarse focus torque
adjustment knob
Optical path
switching lever
Coarse focus knob
Fine focus knob
Moving claw of the
s
p
ecimen holde
r
Condenser focus knob
Lamphouse
DSC connecto
r
A
nalyzer IN/OUT knob
[Analyzer tube for
first-order
red compensation]
[Condenser]
X knob
Y knob
Power switch
Capture button
ND filter IN/OUT switch
(equipped with Ci-S only)
Field diaphragm dial
Coarse focus clamp ring
Coarse focus knob
Fine focus knob
Aperture diaphragm
leve
r

Nikon eclipse Ci-L Specifications

General

Brand	Nikon
Model	eclipse Ci-L
Category	Microscope
Language	English