TDS 420A, TDS 430A, TDS 460A & TDS 510A User Manual
3–73
Measuring Waveforms
There are various ways to measure properties of waveforms. You can use
graticule, cursor, or automatic measurements. This section describes automatic
measurements. (For cursor and graticule measurements, see Taking Cursor
Measurements on page 3–117 and Taking Graticule Measurements on
page 3–82.)
Automatic measurements are generally more accurate and are quicker than, for
example, manually counting graticule divisions. The oscilloscope continuously
updates and displays automatic measurements. (There is also a way to display all
the measurements at once — see Take a Snapshot of Measurements on
page 3–81.)
Automatic measurements are taken over the entire waveform record or, if you
specify gated measurements, over the region specified by the vertical cursors.
(See Gated Measurements on page 3–77.) Automated measurements are not
performed just on the displayed portions of waveforms.
Measurement List
The Digitizing Oscilloscope provides you with 25 automatic measurements.
Table 3–5 lists brief definitions of the measurements.
Table 3–5: Measurement Definitions
Name Definition
Amplitude Voltage measurement. The high value less the low value measured over the entire waveform or
gated region.
Amplitude = High – Low
Area Voltage over time measurement. The area over the entire waveform or gated region in volt-se-
conds. Area measured above ground is positive; area below ground is negative.
Burst Width Timing measurement. The duration of a burst. Measured over the entire waveform or gated region.
Cycle Area Voltage over time measurement. The area over the first cycle in the waveform, or the first cycle in
the gated region, in volt-seconds. Area measured above ground is positive; area below ground is
negative.
Cycle Mean Voltage measurement. The arithmetic mean over the first cycle in the waveform, or the first cycle in
the gated region.
Cycle RMS Voltage measurement. The true Root Mean Square voltage over the first cycle in the waveform, or
the first cycle in the gated region.
Delay Timing measurement. The time between the MidRef crossings of two different traces, or the gated
region of the traces.
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