2
System Description
This chapter contains the follo wing information.
A description of the HP 8510 Pulsed-RF Network Analyzer System.
A simplied blo ck diagram of the HP 8510 Pulsed-RF Network Analyzer System.
A signal ow diagram of the HP 85110-series S-parameter Test Set.
Who Should Make Pulsed-RF Measurements?
Pulsed-RF stim
ulus ma
y
b
e
required
in
cases
where
con
tin
uous
application
of
the
test
signal
could
destro
y
the
device,
suc
h
as
when
testing
o
ccurs
prior
to
pack
aging, or
where the
device
m
ust
b
e
tested
using
a
PRF
and
duty
cycle that
accurately
represen
ts
its
nal
application.
The
HP
8510 pulsed-RF
netw
ork
analyzer
conguration
adds
sp
ecialized
hardw
are
and
an
optimized
rm
w
are
feature
set
to
mak
e
fully
error-corrected
S-parameter
measuremen
ts
of
pulsed-RF
resp
onses.
F
or
the
rst
time,
the
com
bination
of
wideband
IF
and
accurate timing
circuits
pro
vides
precise
sync
hronization
with
the
pulse, allo
wing
S-parameters
to
b
e
measured
at
a
precisely
kno
wn,
rep
eatable
time
during
the pulse.
This
extends
the
HP
8510
applications
in
to
tw
o
ma
jor
areas:
tests
in
whic
h
the
stim
ulus
signal
to
the
device
is
pulsed,
and
tests
of
devices
whic
h
accept
a
CW
input
and
pro
duce
a
pulsed
output.
The
HP
8510
pulsed-RF
net
w
ork
analyzer
system
allo
ws
y
ou
to
calibrate
in
the
same
en
vironmen
t
as
y
our
measuremen
t.
F
or
example,
if
y
ou are
making a
high p
ow
er,
pulsed-RF
measuremen
t,
y
ou
can
calibrate
in the
same high
po
wer,
pulsed-RF
mo
de.
Calibration
data
is
taken only while the pulse is on. This type of calibration mayprevent damage to calibration
standards that would b e damaged in high power, CW calibrations.
The recommended conguration of the HP 85108 Pulsed-RF Network Analyzer consists of the
following items.
HP
8510B/C
net
work
analyzer
equipp
ed
with
Option
008,
Wideband
IF,
and
HP
8510
rm
w
are
revision
B.05.11
or
greater
(for
the
HP 8510B),
or
revision
C.06.54
or
greater
(for
HP 8510C).
HP 83622 syn
thesized sw
eeper with options 001, 003, 004, and
008.
HP 83624
synthesized sweeper with options 003, 004, and 008.
HP 85110-series pulsed-RF fundamen
tally mixed S-parameter test set
Also, other external equipmentsuchaspower ampliers, bias supplies and pulse generators
ma
y
b
e
included in
the
system.
System
Description
2-1