Subroutine descriptions ............................................................ 3-1
Subroutine descriptions
beta1
This subroutine calculates the DC beta () of a test device at constant emitter current (I
E
) and collector-base bias
(V
CB
). The device is in the common-base configuration.
Usage
double beta1(int e, int b, int c, int sub, double ie, double vcb, char type);
The emitter pin of the device
The base pin of the device
The collector pin of the device
The substrate pin of the device
The forced emitter current, in amperes
The forced c to b bias, in volts
Type of transistor: "N" or "P"
The calculated beta of the device:
-1.0 = TYPE not "N" or "P"
-2.0 = SMU2 overload
-3.0 = Divide by 0, or < 0.01
-4.0 = > 10 K or I
B
wrong sign
-5.0 = Emitter voltage limit reached; developed emitter voltage is
within 98 % of the 3 V voltage limit
Details
If a positive substrate pin is specified, the substrate is grounded. If a positive substrate pin is not
specified, the substrate is left floating.
A delay is incorporated into the beta1 subroutine; this delay is the calculated time required for stable
forcing of emitter current with a 3 V voltage limit.
Test subroutine library reference