Keithley S530 User Manual

Section 3: Test subroutine library reference S530 Parametric Test System Test Subroutine Library User's Manual
3-44 S530-907-01 Rev. A / September 2015
Example
result = idss(d, g, s, sub, vdss, idlim, f, &idsat, &vdsat)
Schematic
iebo
This subroutine measures the reverse-bias leakage current through the emitter-base diode of a bipolar transistor
with the base grounded and collector terminal floating.
Usage
double iebo(int e, int b, int c, int s, double vebo, double vsub)
e
Input
The emitter pin of the device
b
Input
The base pin of the device
c
Input
The collector pin of the device
sub
Input
The substrate pin of the device
vebo
Input
Emitter-base voltage, in volts
vsub
Input
Substrate bias, in volts
Returns
Output
Reverse-bias leakage current:
 +4.0E+21 = Current limit reached, measured current is within
98 % of the 1 mA limit
Details
If a zero or negative substrate pin is specified, the substrate is left floating. If the pin number is
greater than 0 and V
SUB
is less than 0.9 mV, the substrate is grounded. In all other cases, it is
connected and forced.
V/I polarities
NPN +V
EB
and -V
SUB
PNP -V
EB
and -V
SUB
Source-measure units (SMUs)
 SMU1: Forces vebo, 1 mA current limit, measures leakage current
 SMU2: Forces vsub, default current limit

Keithley S530 Specifications

General

Brand	Keithley
Model	S530
Category	Test Equipment
Language	English