Keithley S530 User Manual

S530 Parametric Test System Test Subroutine Library User's Manual Section 3: Test subroutine library reference
S530-907-01 Rev. A / September 2015 3-29
fndtrg
This subroutine determines which native mode trigger to use.
Usage
int fndtrg(double low, double high)
low
Input
The low value
high
Input
The high value
Returns
Output
TRUE = Use the Less Than trigger
FALSE = Use the Greater Than trigger
Details
This subroutine compares the algebraic magnitudes of the input parameters and sets its return value
TRUE if TRIGL should be used or FALSE if TRIGH should be used.
Example
result = fndtrg(low, high)
fvmi
This primitive subroutine forces a voltage and measures a current on a device with four input pins and four ground
pins.
Usage
double fvmi(int h1, int h2, int h3, int h4, int l1, int l2, int l3, int l4, double
v, double *i);
h1
Input
HI pin 1
h2
Input
HI pin 2
h3
Input
HI pin 3
h4
Input
HI pin 4
l1
Input
LO pin 1
l2
Input
LO pin 2
l3
Input
LO pin 3
l4
Input
LO pin 4
v
Input
Forced voltage, in volts
i
Output
Measured current
Returns
Output
Measured current:
 0.0 = All high or low pins are < 1
 +4.0E+21 = Measured voltage is within 98 % of the default current
limit
Details
This subroutine is normally used for defect structures with multiple high pins and ground pins.

Keithley S530 Specifications

General

Brand	Keithley
Model	S530
Category	Test Equipment
Language	English