Keithley S530 User Manual

Section 3: Test subroutine library reference S530 Parametric Test System Test Subroutine Library User's Manual
3-24 S530-907-01 Rev. A / September 2015
Source-measure units (SMUs)
See the vtext2 (on page 3-76) subroutine.
Example
Result = deltl1(d1, g1, s1, sub1, l1, d2, g2, s2, sub2, l2, vlow, vhigh, vds,
vbs, ithr, vstep, npts, &kflag)
deltw1
This subroutine estimates the gate width reduction parameter (W) for a MOSFET using two values of threshold
voltage (V
T
) obtained from the vtext2 subroutine.
Usage
double deltw1(int d1, int g1, int s1, int sub1, double w1, int d2, int g2, int s2,
int sub2, double w2, double vlow, double vhigh, double vds, double vbs, double
ithr, double vstep, int npts, int *kflag)
d1
Input
The drain pin of Q1
g1
Input
The gate pin of Q1
s1
Input
The source pin of Q1
sub1
Input
The substrate pin of Q1
w1
Input
The drawn gate width of Q1, in microns
d2
Input
The drain pin of Q2
g2
Input
The gate pin of Q2
s2
Input
The source pin of Q2
sub2
Input
The substrate pin of Q2
w2
Input
The drawn gate width of Q2, in microns
vlow
Input
Start of the gate-source voltage (V
GS
) search, in volts
vhigh
Input
End of the V
GS
search, in volts
vds
Input
Drain bias, in volts
vbs
Input
Substrate bias, in volts
ithr
Input
Drain-source trigger current (I
DS
), in amperes
vstep
Input
V
GS
step size, in volts
npts
Input
Number of points in the V
GS
sweep
kflag
Output
Returned status flag:
 0 = Normal completion
 1 = First V
T
measurement failed
 2 = Second V
T
measurement failed
Returns
Output
Estimated gate width reduction

Keithley S530 Specifications

General

Brand	Keithley
Model	S530
Category	Test Equipment
Language	English