Keithley S530 User Manual

S530 Parametric Test System Test Subroutine Library User's Manual Section 3: Test subroutine library reference
S530-907-01 Rev. A / September 2015 3-27
fimv
This subroutine forces a current and measures a voltage on a device with four high (source) pins and four ground
pins. This is an alternate version of the fvmi subroutine.
Usage
double fimv(int h1, int h2, int h3, int h4, int l1, int l2, int l3, int l4, double
*v, double i);
h1
Input
HI pin 1
h2
Input
HI pin 2
h3
Input
HI pin 3
h4
Input
HI pin 4
l1
Input
LO pin 1
l2
Input
LO pin 2
l3
Input
LO pin 3
l4
Input
LO pin 4
v
Output
Measured voltage
i
Input
Forced current, in amperes
Returns
Output
Measured voltage:
0.0 = All high or low pins are <1
Details
Input a -1 if the pin is not to be used.
A delay is incorporated into the fimv subroutine; this delay is the calculated time required for stable
forcing of i with a 30 V voltage limit (default).
Source-measure units (SMUs)
 SMU1: Forces current, default voltage limit, measures voltage
Example
result = fimv(h1, h2, h3, h4, l1, l2, l3, l4, &v, i);
Schematic
Figure 7: Schematic for the fimv subroutine

Keithley S530 Specifications

General

Brand	Keithley
Model	S530
Category	Test Equipment
Language	English