Section 3: Test subroutine library reference S530 Parametric Test System Test Subroutine Library User's Manual
3-56 S530-907-01 Rev. A / September 2015
res2
This subroutine measures two-terminal resistance with a voltage limit.
Usage
double res2(int hi, int lo, int sub, double itest, double vlim)
The substrate pin of the device
The forced current, in amperes
The voltage limit, in volts
The calculated resistance:
0.0 = Measured voltage is < 0.002 V or itest = 0.0
2.0E+21 = Measured voltage is within 98 % of the voltage limit
Details
This subroutine measures the resistance of a two-terminal resistor by forcing a current and measuring
the voltage.
If a positive substrate pin is specified, the substrate is grounded. If a positive substrate pin is not
specified, the substrate is left floating.
A delay is incorporated into the res2 subroutine; this delay is the calculated time required for stable
forcing of itest with vlim voltage limit.
Source-measure units (SMUs)
SMU1: Forces itest, programmable voltage limit, measures voltage
Example
result = res2(hi, lo, sub, itest, vlim)
Schematic