Section 3: Test subroutine library reference S530 Parametric Test System Test Subroutine Library User's Manual
3-4 S530-907-01 Rev. A / September 2015
Example
result = beta2 (e, b, c, sub, ice, vce, &vbeout, &icout, type);
Schematic
beta2a
This subroutine calculates beta () at collector-base voltage (V
CB
) and collector-emitter current (I
CE
) using the
searchi and trig LPTLib functions to search emitter current (I
E
) until the target I
CE
is reached. The device is in
the common-base configuration.
Usage
double beta2a(int e, int b, int c, int sub, double ice, double vcb, double ie1,
double ie2, double vsub, double *icmeas, double *ieout, double *error);
The emitter pin of the device
The base pin of the device
The collector pin of the device
The substrate pin of the device
The targeted collector current, in amperes
The forced c to b bias, in volts
The start of the emitter current search, in amperes
The end of the emitter current search, in amperes
The forced substrate bias, in volts
The final measured collector-emitter current
The final forced value of emitter current
The percent error between the target collector current (I
CE
) and the final
measured collector current (I
CMEAS
)
-1.0 = Target I
CE
= 0.0
-2.0 = Collector current limit reached
-3.0 = Emitter voltage limit reached