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Keithley S530 User Manual

Keithley S530
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S530 Parametric Test System Test Subroutine Library User's Manual Section 3: Test subroutine library reference
S530-907-01 Rev. A / September 2015 3-37
icbo
This subroutine measures leakage when the collector-base junction is reverse-biased (common base).
Usage
double icbo(int e, int b, int c, int sub, double vcbo, double vsub)
e
Input
b
Input
c
Input
sub
Input
vcbo
Input
vsub
Input
Returns
Output
Details
This subroutine measures the collector-base leakage current at a specified collector-base voltage
(V
CB
) and substrate bias (V
SUB
) for a bipolar transistor. The emitter pin is not connected (floating), and
the base is grounded.
If a zero or negative substrate pin is specified, the substrate is left floating. If the pin number is
greater than 0 and V
SUB
is less than 0.9 mV, the substrate is grounded. In all other cases, it is
connected and forced.
V/I polarities
NPN +V
CB
, -V
SUB
PNP -V
CB
, -V
SUB
Source-measure units (SMUs)
SMU1: Forces V
CB
, default current limit, measures icbo
SMU2: Forces vsub, default current limit

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Keithley S530 Specifications

General IconGeneral
BrandKeithley
ModelS530
CategoryTest Equipment
LanguageEnglish

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