S530 Parametric Test System Test Subroutine Library User's Manual Section 3: Test subroutine library reference
S530-907-01 Rev. A / September 2015 3-37
icbo
This subroutine measures leakage when the collector-base junction is reverse-biased (common base).
Usage
double icbo(int e, int b, int c, int sub, double vcbo, double vsub)
The emitter pin of the device
The base pin of the device
The collector pin of the device
The substrate pin of the device
Forced collector-base voltage, in volts
The forced substrate bias, in volts
The measured collector-base current
Details
This subroutine measures the collector-base leakage current at a specified collector-base voltage
(V
CB
) and substrate bias (V
SUB
) for a bipolar transistor. The emitter pin is not connected (floating), and
the base is grounded.
If a zero or negative substrate pin is specified, the substrate is left floating. If the pin number is
greater than 0 and V
SUB
is less than 0.9 mV, the substrate is grounded. In all other cases, it is
connected and forced.
V/I polarities
NPN +V
CB
, -V
SUB
PNP -V
CB
, -V
SUB
Source-measure units (SMUs)
SMU1: Forces V
CB
, default current limit, measures icbo
SMU2: Forces vsub, default current limit