Keithley S530 User Manual

Section 3: Test subroutine library reference S530 Parametric Test System Test Subroutine Library User's Manual
3-54 S530-907-01 Rev. A / September 2015
The I
B
versus V
CE
curve has a flyback region where V
CE
decreases as I
B
increases (the curve has a
negative slope). The re subroutine drops all points with a negative slope in its calculation of the
emitter resistance. An error code, "IFLAG=1" is generated if there are too few remaining points to
continue the calculation of re.
A delay is incorporated into the re subroutine; this delay is the calculated time required for stable
forcing of I
BE
with a 30 V voltage limit.
If a zero or negative substrate pin is specified, the substrate is left floating. If the pin number is
greater than 0 and V
SUB
is less than 0.9 mV, the substrate is grounded. In all other cases, it is
connected and forced.
V/I polarities
NPN +I
BE
and -V
SUB
PNP -I
BE
and -V
SUB
Source-measure units (SMUs)
 SMU1: Set to VMTR, measures V
CE
 SMU2: Sweeps I
BE
, 3 V voltage limit
 SMU3: Forces vsub, default current limit
Example
result = re(e, b, c, sub, ib1, ib2, vsub, npts, &iflag, &r)
Schematic

Keithley S530 Specifications

General

Brand	Keithley
Model	S530
Category	Test Equipment
Language	English