In this section:
Introduction .............................................................................. 7-1
Equipment required .................................................................. 7-1
Set up remote communications ................................................ 7-2
Set up external hardware triggers ............................................ 7-2
Device connections .................................................................. 7-5
Remote control of FET testing using SCPI commands ............ 7-6
Remote control of FET testing using TSP commands ............ 7-10
Introduction
This example application demonstrates how to use two 2450 instruments to perform I-V
characterization of field effect transistors (FETs). The 2450 is a good choice for semiconductor device
testing because it can quickly and accurately source and measure both current and voltage.
Determining the I-V parameters of FETs helps you ensure that they function properly in their intended
applications, and that they meet specifications. There are many I-V tests that you can perform with
the 2450, including gate leakage, breakdown voltage, threshold voltage, transfer characteristics, and
drain current. The number of 2450 instruments required for testing depends on the number of FET
terminals that must be biased and measured.
This application shows you how to perform a drain family of curves (Vds-Id) on a three-terminal
MOSFET. The MOSFET is the most commonly used FET because it is the basis for digital integrated
circuits.
Equipment required
• Two 2450 SourceMeter
®
Instruments
• Four triaxial cables (Keithley model number 7078-TRX-10)
• A metal-shielded test fixture or probe station with female triaxial connectors
• A triaxial tee connector (Keithley model number 237-TRX-T)
Section 7
Measuring I-V characteristics of FETs
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