Model 6517A Getting Started Manual Measurement Options 2-23
Figure 2-6
Combining math calculations
Test sequences
The following information summarizes the built-in test sequences of the Model 6517A.
Detailed information on test sequences can be found in the User’s Manual.
Selecting and configuring a test sequence
A test sequence is selected and configured from the CONFIGURE SEQUENCE menu as
follows:
1. Press CONFIG and then SEQ to display the sequence configuration menu.
2. Place the cursor (using
and
keys) on APPLICATIONS and press ENTER.
Select and configure a test from the test sequence menu structure. To select a menu
item, place the cursor (using
and
keys) on it and press ENTER. To change a
parameter value, use the cursor and RANGE keys, and press ENTER.
DEV-CHAR — Use to select a device characterization test:
DIODE: Diode leakage current test — Specify start voltage, stop voltage, step
voltage and delay.
CAPACITOR: Capacitor leakage current test — Specify bias voltage, bias
time, and discharge time.
CABLE: Cable insulation resistance test — Specify bias voltage and bias time.
RESISTOR: Resistor voltage coefficient test — Specify source 1 voltage,
delay 1, source 2 voltage, and delay 2.
RESISTIVITY — Use to select a resistivity test:
SURFACE: Surface resistivity test — Specify pre-discharge time, bias volt-
age, bias time, measure voltage, measure time, and discharge time.
VOLUME: Volume resistivity time — Specify pre-discharge time, bias volt-
age, bias time, measure voltage, measure time, and discharge time.
Math
Polynomial,
Percent,
Percent Deviation,
Ratio, Logarithmic
Value Displayed
Raw
Measurement
Multiple Displays
MAX, MIN
To Next Page
Loading...
Need help?
General
