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Tektronix MDO4054-3 User Manual

Tektronix MDO4054-3
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Analyze Wavefor
morTraceData
Selecting Automatic Measurements in the Time Domain
The following tables list each automatic measurement by category: time or amplitude. (See page 121, Taking Automatic
Measurements in the Time Domain.)
Time measurements
Measurement Description
Frequency
The rst cycle in a waveform or gated region. Frequency is the reciprocal of the period; it
is measured in hertz (Hz) where one Hz is one cycle per second.
Period
The time required to complete the rst cycle in a waveform or gated region. Period is
the recipro
cal of frequency and is measured in seconds.
Rise Time
The time required for the l eading edge of the rst pulse in the waveform or gated region
to rise from the low reference value (default = 10%) to the high reference value (default =
90%) of the nal value.
Fall Time
The time required for the falling edge of the rst pulse in the waveform or gated region to
fall from the high reference value (default = 90%) to the low reference v alue (default =
10%) of the nal value.
Delay
The time between the mid reference (default 50%) amplitude point of two different
waveforms. See also Phase.
Phase
The amount of time that one waveform leads or lags another waveform, expressed in
degree
s where 360° makes up one waveform cycle. See also Delay.
Positive Pulse
Width
The distance (time) between the m id reference (default 50%) amplitude points of a
positive pulse. The measurement is made on the rst pulse in the waveform or gated
region.
Negative Pulse
Width
The distance (time) between the m id reference (default 50%) amplitude points of a
negative pulse. The measurement is made on the rst pulse in the waveform or gated
region.
Positive Duty
Cycle
The ratio of the positive pulse width to the signal period expressed as a percentage. The
duty cycle is measured on the rst cycle in the waveform or gated region.
122 MDO4000 Series Oscilloscopes User Manual

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Tektronix MDO4054-3 Specifications

General IconGeneral
BrandTektronix
ModelMDO4054-3
CategoryTest Equipment
LanguageEnglish

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