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ABB AO2000-LS25 User Manual

ABB AO2000-LS25
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10 AO2000-LS25 LASER ANALYZERS | OI/AO2000-LS25-EN REV. D
2 Use in potentially explosive atmospheres in accordance with ATEX and IECEx
Use in ATEX / IECEx Zone 1
Installing the pressurized enclosure
Purge parameters for pressurized enclosure
The purging and monitoring unit must guarantee the following
purge parameters.
Parameter
Variant 1
Variant 2
Purge gas
Air / N
2
Air / N
2
Internal free volume
12
l
12
l
Min. purge current
11
l/min
48
l/min
Min. purge time
3 min 40 sec
1 min 15 sec
Min. overpressure
0.8
mbar
4
mbar
Max. overpressure
20
mbar
20
mbar
Max. leakage rate
2 l/min
2 l/min
Table 3: Ex “p” specifications
Purge air properties for pressurized enclosure
Parameter
Value/Description
Quality
Class 533, in accordance with
DIN ISO 8573-1
Temperature
Maximum 55 °C*
Flow rate
See Table 3: Ex “p” specifications
Table 4: Purge air characteristics
* in accordance with EN 60079-2 (pressurized enclosure, Ex “p”)
Installation
NOTICE
Damage to the optical components
Damage to the optical components due to contaminated
purge gas.
The purge gas must meet the quality requirements in
accordance with Table 4 on page 10.
Note
The gas analyzer meets Ex approval only with a suitably
approved purging and monitoring unit for the pressurized
enclosure.
The components of the pressurized enclosure are not
included in the standard delivery scope of the device, but can
optionally be supplied by ABB.
The installation of the pressurized enclosure must be performed
according to the schematic diagram in Figure 1 on page 7.
Metal pipes with a 6 mm outside diameter are used as purge
gas lines and are connected to the corresponding Swagelok®
fittings on the transmitter and receiver unit.
A
Purge gas inlet from the transmitter unit
B
Purge gas inlet to the purging and monitoring unit
C
Do not use.
Figure 2: Purge gas connection to the receiver unit (air as purge gas)

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ABB AO2000-LS25 Specifications

General IconGeneral
BrandABB
ModelAO2000-LS25
CategoryMeasuring Instruments
LanguageEnglish

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