Part III Appendix
Description of Self-Test Items 239
Test failure analysis
If the test result is NaN, the maintenance personnel end the test during the test process.
If the test result is FAIL, the CPU temperature is too high.
Troubleshooting suggestion
First check whether the air inlets and dust filters are blocked, whether the fans are blocked, and
whether the CPU radiator and heat-conducting cream are in good contact. If the test result is still
FAIL, replace the PC module.
2.3 Z0201 DDR Full-Space Read/Write Test
Upper-level test item
None
Test content
Perform a full-space read/write test for the class-3 DDRs mounted to the multifunctional FPGA.
The program will respectively distinguish the cache DDR (for transmitting intermediate processing
results of the FPGA), scan buffer DDR (for transmitting scan control frames), and IQ buffer DDR
(for transmitting IQ data).
Test failure analysis
If the test result is Error, the drive malfunctions.
If the test result is FAIL, the connections between the FPGA and the mounted DDRs are abnormal.
Troubleshooting suggestion
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