Part III Appendix
Description of Self-Test Items 256
b If the test result is NaN, reassembly the CW board. If the test result is still NaN, replace the
4D/TEE/CW board. If the problem persists, replace the main board.
2.34 Z1002 TEE Temperature Signal Test
Upper-level test item
4D/TEE/CW Board In-Position Test
Test content
Read the value of the TEE temperature signal. If a value can be sampled, TEE temperature signal
collection is normal.
Test failure analysis
If the test result is Error, the drive malfunctions.
If the test result is FAIL, the TEE temperature signal collection link is faulty.
Troubleshooting suggestion
a If the test result is Error, restart the equipment and re-perform the self-test. If the problem
persists, recover the equipment.
b If the test result is FAIL, replace the 4D/TEE/CW board.
2.35 Z1003 TEE Angle Signal Test
Upper-level test item
4D/TEE/CW Board In-Position Test
Test content
Read the value of the TEE angle signal. If a value can be sampled, TEE angle signal collection is
normal.
Test failure analysis
If the test result is Error, the drive malfunctions.
If the test result is FAIL, the TEE angle signal collection link is faulty.
Troubleshooting suggestion
a If the test result is Error, restart the equipment and re-perform the self-test. If the problem
persists, recover the equipment.
b If the test result is FAIL, replace the 4D/TEE/CW board.
2.36 Z1004 CW Mode Pressure Test
Upper-level test item
4D/TEE/CW Board In-Position Test
Test content
On the FPGA, set the PHV2 pressure and set four levels for the CW voltage. Read and check
whether the voltage values at the four levels are within the specified range.
Test failure analysis