Agilent Technologies 4263B User Manual

4263B
When
measuring DCR
or R2
,
the
actual
test
current
level
through
the
DUT
can
be
obtained
as
follows:
The
source resistance
,
Rs
,
is
selected
by
measured
the
DUT's
resistance
value
,R
DUT
.
DC Resistance
Value
Rs
0


R
DUT

1

25

1

<
R
DUT
100

The actual
current value
,
I,
is
calculated
using
the
following
equation:
I
=
6
2
R
D
U
T
+
R
s
T
est
Current
Transient
When
measuring
the
DC
resistance
of
a
DUT
that has
reactive characteristics
,you
must
pay
attention
to
the
transient
phenomena
of
the measurement
circuit.
Figure
3-13
shows
the
transient
current
of
L
-
DC
Resistance
measurement.
The
measurement circuit
for a
inductance measurement
is
shown
in
simplied
form
in
Figure
3-13 (a).
The equivalent
model of
the DUT
is
series
R-L.
The
test
signal,
E(t),
shown
in
Figure
3-13
(b),
is
applied
to
the
measurement
circuit
and
test
current
I(t)
ows
as
shown
in
Figure
3-13
(b).
If
the
DUT's
time
constant,
which
is
obtained
by
L
R
,
is
large
,
it
will
take
a
long
time
for
the
test
signal
to
reach
a
steady
state
,
which
is
expressed
by
the
dotted
line
in
Figure
3-13
(b).
The
4263B
has
measurement
delay
times
,
T
d
1
or
T
d
2
,
at
each
point
when
the
test
signal
level
changes
.
T
d
1
is
the
trigger
delay
time
,
which
is
set
by
the
delay
key
(refer
to
\Delay
Key
").
T
d
2
is
decided
as
follows:
Trigger
Delay
Setting
(T
d
1
)
Delay
Time
in
DC
Resistance
Measurement
(T
d
2
)
0

td
1

40
ms
40
ms
40
ms <
td
1
T
d
2
=
Td
1
Y
ou
must
set
the delay
time so
that the
measurement will
be started
when the
test signal
has
reached
a
steady
state
.F
or
selection
of
delay
time
,
depending
on
the
L,
refer to
\Measuring
High Inductance Transformers" in Chapter 6.
Function Reference and Technical Information 3-33

Agilent Technologies 4263B Specifications

General

Brand	Agilent Technologies
Model	4263B
Category	Measuring Instruments
Language	English