RM23712 TPS
21
3.2.1.10.4 Surge Immunity
The power supply shall be tested with the system for immunity to AC Ringwave and AC
Unidirectional wave, both up to 2kV(Differential mode 2K,Common mode 1K), per EN55024:1998,
EN 61000-4-5:1995 and ANSI C62.45:1992.
The pass criteria include: No unsafe operation is allowed under any condition; all power supply
output voltage levels to stay within proper spec levels; No change in operating state or loss of data
during and after the test profile; No component damage under any condition.
The power supply shall comply with the limits defined in EN55024:1998 using the IEC
61000-4-5:1995 test standard and performance criteria B defined in Annex B f CISPR 24.
3.2.1.10.5 AC Line Transient Specification
AC line transient conditions shall be defined as “sag” and “surge” conditions.
“Sag” conditions are also commonly referred to as “brownout”, these conditions will be
defined as the AC line voltage dropping below nominal voltage conditions.
“Surge” will be defined to refer to conditions when the AC line voltage rises above nominal
voltage.
The power supply shall meet the requirements under the following AC line sag and surge conditions.
Table 18.AC Line SAG transient performance
AC Line SAG (10sec interval between each sagging)
No loss of function or performance
Loss of function acceptable,self
recoverable
Table 19.AC Line SURGE transient performance
No loss of function or performance
Mid-point of nominal
AC voltage
No loss of function or performance
3.2.1.10.6 AC line fast transient (EFT) specification
The power supply shall meet the EN61000-4-5 directive and any additional requirements in
IEC1000-4-5:1995 and the level 3 requirements for surge-withstand capability, with the following
conditions and exceptions:
These input transients must not cause any out-of-regulation conditions, such as overshoot and
undershoot, normust it cause any nuisance trips of any of the power supply protection circuits.
The surge-withstand test must not produce damage to the power supply.
The supply must meet surge-withstand test conditions under maximum and minimum
DC-output load conditions.