IEEE-488 Reference
3-59
:TSEQuence
:TSOurce?
:TLINe <NRf>
:TLINe?
DLEakage
:STARt <NRf>
:STARt?
:STOP <NRf>
:STOP?
:STEP <NRf>
:STEP?
:MDELay <NRf>
:MDELay?
:CLEakage
:SVOLtage <NRf>
:SVOLtage?
:SPOints <NRf>
:SPOints?
:SPINterval <NRf>
:SPINterval?
:CIResistance
:SVOLtage <NRf>
:SVOLtage?
:SPOints <NRf>
:SPOints?
:SPINterval <NRf>
:SPINterval?
:RVCoefficient
:SVOLtage[1] <NRf>
:SVOLtage[1]?
:MDELay[1] <NRf>
:MDELay[1]?
:SVOLtage2 <NRf>
:SVOLtage2?
:MDELay2 <NRf>
:MDELay2?
:SRESistivity
:PDTime <NRf>
:PDTime?
:SVOLtage <NRf>
:SVOLtage?
:STIME <NRf>
:STIME?
:MVOLtage <NRf>
:MVOLtage?
:MTIMe <NRf>
:MTIMe?
:DTIMe <NRf>
:DTIMe?
:VRESistivity
:PDTime <NRf>
:PDTime?
:SVOLtage <NRf>
:SVOLtage?
Query trigger source.
Specify TLINk line; 1 to 6.
Query TLINk line.
Diode leakage test path:
Specify start voltage; -1000 to 1000.
Query start voltage.
Specify stop voltage; -1000 to 1000.
Query stop voltage.
Specify step voltage; -1000 to 1000.
Query step voltage.
Specify measure delay; 0 to 10000.0(sec).
Query measure delay.
Capacitor leakage test path:
Specify bias voltage (-1000 to 1000).
Query bias voltage.
Number points (1 to Max Buffer).
Query number of points.
Interval between points: 0 to 99999.9(sec).
Query interval.
Cable insulation resistance test path:
Specify bias voltage; -1000 to 1000.
Query bias voltage.
Number points (1 to Max Buffer).
Query number of points.
Interval between points: 0 to 99999.9(sec).
Query interval.
Resistor voltage coefficient test path:
Specify source voltage 1; -1000 to 1000.
Query source voltage.
Specify measure delay 1; 0 to 99999.9(sec).
Query measure delay.
Specify source voltage 2; -1000 to 1000.
Query source voltage.
Specify measure delay 2; 0 to 99999.9(sec).
Query measure delay.
Surface resistivity test path:
Specify pre-discharge time; 0 to 9999.9(sec).
Query pre-discharge time.
Specify bias voltage; -1000 to 1000.
Query bias voltage.
Specify bias time; 0 to 99999.9(sec).
Query bias time.
Specify measure votlage; -1000 to 1000.
Query measure voltage.
Specify measure time; 0 to 9999.9(sec).
Query measure time.
Specify discharge time; 0 to 99999.9(sec).
Query discharge time.
Volume resistivity test path:
Specify pre-discharge time; 0 to 99999.9(sec).
Query pre-discharge time.
Specify bias voltage; -1000 to 1000.
Query bias voltage.
1
+1V
+10V
+1V
1 sec
+1V
10
1sec
+1V
5
1 sec
+1V
1 sec
+2V
1sec
0.2 sec
+500V
1 sec
+500V
1 sec
2 sec
10 sec
+500V
3.25.1
3.25.2
3.25.3
3.25.4
3.25.5
3.25.6
3.25.21
3.25.22
3.25.6
3.25.21
3.25.22
3.25.6
3.25.5
3.25.6
3.25.5
3.25.9
3.25.6
3.25.7
3.25.10
3.25.11
3.25.8
3.25.9
3.25.6
Table 3-16 (Continued)
:TSEQuence command summary
Command Description
Default
parameter SCPI Ref.