IEEE-488 Reference
3-152
3.25.8 :DTIMe <NRf> :TSEQuence:SRESistivity:DTIMe <NRf> Discharge time; sur resistivity test
:TSEQuence:VRESistivity :DTIMe <NRf> Discharge time; vol resistivity test
Parameters <NRf> = 0 to 99999.9 (seconds)
Query :DTIMe? Query discharge time
Description This configuration command is used for the following tests:
Surface Resistivity Test
Volume Resistivity Test
This command is used to specify the discharge time for the specified test.
3.25.9 :PDTime <NRf> :TSEQuence:SRESistivity:PDTime <NRf> Pre-discharge time; surface resistivity test
:TSEQuence:VRESistivity:PDTime <NRf> Pre-discharge time; volume resistivity test
Parameters <NRf> = 0 to 99999.9 (seconds)
Query :PDTime? Query pre-discharge time
Description This configuration command is used for the following tests:
Surface Resistivity Test
Volume Resistivity Test
This command is used to specify the pre-discharge time for the specified test.
3.25.10 :MVOLtage <NRf> :TSEQuence:SRESistivity:MVOLtage <NRf> Measure voltage; sur resistivity test
:TSEQuence:VRESistivity:MVOLtage <NRf> Measure voltage; vol resistivity test
:TSEQuence:SIResistance:MVOLtage <NRf> Measure voltage; sur insul resistance test
Parameters <NRf> = -100.0 to 100.0 Volts; 100V range
-1000 to 1000 Volts; 1000V range
Query :MVOLtage? Query measure voltage
Description This configuration command is used for the following tests:
Surface Resistivity Test
Volume Resistivity Test
Surface Insulation Resistance Test
This command is used to specify the measure voltage for the specified test.