IEEE-488 Reference
3-154
3.25.15 :LTIMe <NRf> :TSEQuence:SQSWeep:LTIMe <NRf> Low level time; square wave sweep test
Parameters <NRf> = 0 to 9999.9 (seconds)
Query :LTIMe? Query low level time
Description This configuration command is used for the following tests:
Square Wave Sweep Test
This command is used to specify the low level time for the square wave sweep test.
3.25.16 :COUNt <NRf> :TSEQuence:SQSWeep:COUNt <NRf> Specify cycle count
Parameters <NRf> = 1 to MAX/2 See table 2-22
Query :COUNt? Query cycle count
Description This command is used to specify how many times to repeat the programmed square wave cycle.
3.25.17 :OFSVoltage <NRf>
:TSEQuence:ALTPolarity:OFSVoltage <NRf> Specify offset voltage
Parameters <NRf> = -1000 to 1000 Offset voltage
Query :OFSVoltage? Query offset voltage
Description This command is used to specify the offset voltage for the Alternating Polarity
Resistance/Resistivity test.
3.25.18 :ALTVoltage <NRf>
:TSEQuence:ALTPolarity:ALTVoltage <NRf> Specify alternating voltage
Parameters <NRf> = -1000 to 1000 Alternating voltage
Query :ALTVoltage? Query alternating voltage
Description This command is used to specify the alternating voltage for the Alternating Polarity
Resistance/Resistivity test.
3.25.19 :READings <NRf>
:TSEQuence:ALTPolarity:READings <NRf> Specify number of readings to store
Parameters <NRf> = 1 to MAXimum Specify number of readings
DEFAULT 1
MAXimum See table 2-22
MINimum 1
Query :READings? Query number of readings to store
Description This command is used to specify the number of readings to store for the Alternating Polarity
Resistance/Resistivity test.