Measuring Waveforms
CSA7000B Series & TDS7000B Series Instruments User Manual
3- 141
Figure 3- 35: Annotated display
Customize Measurements. To allow you control over how your waveform data is
characterized by measurements, the instrument lets you set the methods used for
each measurement. See High/Low Method on page 3--142 and Reference Levels
Method on page 3--143.
See Statistics on Measurement Results. To see how automatic measurements vary
statistically, you can display a readout of the Min, Max, Mean, and Standard
Deviation of the measurement results. See Display measurement statistics on
page 3--146 for more information.
Select Measurement Parameters. You can select from an extensive range of
parameters to measure; for a list, see Appendix B: Automatic Measurements
Supported.
Measure Part of a Waveform. You can feed the entire waveform to a measurement
or limit the measurement to a segment of the waveform. By default, the
instrument takes each automatic measurement over the entire waveform record,
but you can use measurement gates and zoom to localize each measurement to a
section of a waveform (see To Localize a Measurement on page 3--149).
Select Measurement Sources. Select from these measurement sources: channel,
reference, and math waveforms.
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